Search Results - "Okada, Atsuhiko"

Comparison of HASTE with multiple signal averaging versus conventional turbo spin echo sequence: a new option for T2-weighted MRI of the female pelvis by Tsuboyama, Takahiro, Takei, Oki, Okada, Atsuhiko, Honda, Toru, Kuriyama, Keiko

“…Objectives This study was conducted in order to evaluate the feasibility of a newly developed half-Fourier acquisition single-shot turbo spin echo (HASTE)…”
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Effect of uterine position and intrapelvic motions on the image quality of 3D T2-weighted MRI of the uterus: Can short prescans predict the non-diagnostic image quality? by Tsuboyama, Takahiro, Takei, Oki, Okada, Atsuhiko, Wada, Keiko, Kuriyama, Keiko

“…•Image quality of the uterus on 3D T2-weighted MRI is affected by a combination of uterine position and intrapelvic motions.•When the uterus contacts the…”
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Magnetic properties of stable N-[(dichlorophenyl)thio]-2,4,6-triphenylphenylaminyl and N-[(dichlorophenyl)thio]-2,4,6-tris(chlorophenyl)phenylaminyl radical crystals by Teki, Yoshio, Itoh, Koichi, Okada, Atsuhiko, Yamakage, Hirokazu, Kobayashi, Tatsuo, Amaya, Kiichi, Kurokawa, Sinya, Ueno, Sadaharu

“…The magnetic properties of N-[(dichlorophenyl)thio]-2,4,6-triarylphenylaminyl radical crystals are reported. The three stable thioaminyls show ferromagnetic…”
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3. Routine MRI Examination for the Contribution of the Suitable Treatment 3-3. MRI Diagnosis of Ovarian Masses by Tsuboyama, Takahiro, Takei, Oki, Okada, Atsuhiko, Wada, Keiko, Kuriyama, Keiko

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Magnetic Properties of Organic Radical Magnets, MOTMP, MATMP and AOTMP by Kobayashi, Tatsuo C., Takiguchi, Masafumi, Hong, Chulun, Okada, Atsuhiko, Amaya, Kiichi, Kajiwara, Atsushi, Harada, Akira, Kamachi, Mikiharu

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On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM by Tanoi, S., Tokunaga, Y., Tanabe, T., Takahashi, K., Okada, A., Itoh, M., Nagatomo, Y., Ohtsuki, Y., Uesugi, M.

“…An on-wafer built-in self-test (BIST) technique has been developed to implement a 200 Gb/s failed-bit search for a 1-Gb DRAM. The BIST circuits include a 4-kb…”
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On-wafer BIST of a 200 Gb/s failed-bit search for 1 Gb DRAM by Tanoi, S., Tokunaga, Y., Tanabe, T., Takahashi, K., Okada, A., Itoh, M., Nagatomo, Y., Ohtsuki, Y., Uesugi, W.

“…For giga-scale DRAM, it is important to reduce test time. Built-in self-test (BIST) for a 1 Gb DRAM realizes a 200 Gb/s failed-search for repair with…”
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