Search Results - "Ohlidal, Miloslav"

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films by Ohlídal, Ivan, Vohánka, Jiří, Buršíková, Vilma, Šulc, Václav, Šustek, Štěpán, Ohlídal, Miloslav

“…The method of variable angle spectroscopic ellipsometry usable for the complete optical characterization of inhomogeneous thin films exhibiting complicated…”
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Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data by Vohánka, Jiří, Šulc, Václav, Ohlídal, Ivan, Ohlídal, Miloslav, Klapetek, Petr

“…Two samples of silicon-single crystal substrates with randomly rough surfaces covered by native oxide layers are investigated by means of angle-resolved…”
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Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry by Vohánka, Jiří, Šustek, Štěpán, Buršíková, Vilma, Šklíbová, Veronika, Šulc, Václav, Homola, Vojtěch, Franta, Daniel, Čermák, Martin, Ohlídal, Miloslav, Ohlídal, Ivan

“…[Display omitted] •Thickness non-uniform films are studied by variable-angle spectroscopic ellipsometry.•The shapes of non-uniformity are modeled using a…”
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Influence of technological conditions on mechanical stresses inside diamond-like carbon films by Ohlídal, Ivan, Ohlídal, Miloslav, Franta, Daniel, Čudek, Vladimír, Buršíková, Vilma, Klapetek, Petr, Páleníková, Kateřina

“…In this paper the influences of the technological conditions, i.e. the influences of the hydrogen flow rate and deposition time, on the values of the intrinsic…”
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Stable a-CSi:H films with a wide range of modulus of elasticity and low internal stress by Plichta, Tomas, Sulc, Vaclav, Ohlidal, Miloslav, Cech, Vladimir

“…Amorphous hydrogenated silicon carbide (a-CSi:H) thin films were deposited by plasma-enhanced chemical vapor deposition using tetravinylsilane as organosilicon…”
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Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology by Vodák, Jiří, Nečas, David, Pavliňák, David, Macak, Jan M, Řičica, Tomáš, Jambor, Roman, Ohlídal, Miloslav

“…[Display omitted] •Metallic gold is reduced from an organometallic compound layer using a plasma jet.•Imaging spectroscopic reflectometry is used to locate…”
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Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry by Nečas, David, Vodák, Jiří, Ohlídal, Ivan, Ohlídal, Miloslav, Majumdar, Abhijit, Zajíčková, Lenka

“…[Display omitted] •Imaging spectroscopic reflectometry data processing method is developed.•Local film thicknesses in each pixel and shared optical constants…”
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Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry by Nečas, David, Ohlídal, Ivan, Franta, Daniel, Čudek, Vladimír, Ohlídal, Miloslav, Vodák, Jiří, Sládková, Lucia, Zajíčková, Lenka, Eliáš, Marek, Vižďa, František

“…Standard variable-angle spectroscopic ellipsometry, mapping spectroscopic ellipsometry with microspot and imaging spectroscopic reflectometry are applied to…”
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Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry by Ohlídal, Ivan, Ohlídal, Miloslav, Nečas, David, Franta, Daniel, Buršíková, Vilma

“…The combined optical method enabling us to perform the complete optical characterisation of weakly absorbing non-uniform thin films is described. This method…”
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Rough surface scattering simulations using graphics cards by Klapetek, Petr, Valtr, Miroslav, Poruba, Aleš, Nečas, David, Ohlídal, Miloslav

“…In this article we present results of rough surface scattering calculations using a graphical processing unit implementation of the Finite Difference in Time…”
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Experimental analysis of irregularities of metallic surfaces generated by abrasive waterjet by Valíček, Jan, Držík, Milan, Hloch, Sergej, Ohlídal, Miloslav, Miloslav, Lupták, Gombár, Miroslav, Radvanská, Agáta, Hlaváček, Petr, Páleníková, Kateřina

“…Experimental study of the surface quality produced by abrasive waterjet (AWJ) on metallic materials has been performed. The surface roughness/waviness was…”
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Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films by Franta, Daniel, Buršíková, Vilma, Ohlídal, Ivan, Sťahel, Pavel, Ohlídal, Miloslav, Nečas, David

“…The aim of the present contribution is the study of the influence of the annealing on the mechanical and optical properties of the plasma deposited…”
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Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films by Ohlídal, Miloslav, Ohlídal, Ivan, Klapetek, Petr, Nečas, David, Buršíková, Vilma

“…Complete optical characterization of diamond-like carbon (DLC) films non-uniform in thickness is performed using spectroscopic imaging reflectometry (SIR). It…”
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Measurement of optical parameters of thin films non-uniform in thickness by Nečas, David, Ohlídal, Ivan, Čudek, Vladimír, Ohlídal, Miloslav, Vodák, Jiří, Zajícková, Lenka, Majumdar, Abhijit

“…A multi-pixel modification of the data fitting procedure for imaging spectroscopic reflectometry is used for the optical characterisation of thin films…”
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Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry by Ohlídal, Ivan, Nečas, David, Buršíková, Vilma, Franta, Daniel, Ohlídal, Miloslav

“…Two formulae expressing the reflectance of non-uniform thin films are presented. The first of them corresponds to the arbitrary shapes of this non-uniformity…”
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Optical characterisation of SiO x C y H z thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry by Ohlidal, Ivan, Ohlidal, Miloslav, Necas, David, Franta, Daniel, Bursikova, Vilma

“…The combined optical method enabling us to perform the complete optical characterisation of weakly absorbing non-uniform thin films is described. This method…”
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Complete Optical Characterization of Non-Uniform SiOx Thin Films Using Imaging Spectroscopic Reflectometry by Ohlídal, Miloslav, Ohlídal, Ivan, Necas, David, Klapetek, Petr

“…Complete optical characterization of SiOx films non-uniform in thickness is performed using imaging spectroscopic reflectometry. It is shown that by using this…”
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Digital laser speckle spectral correlation within the framework of the fresnel approximation of the scalar kirchhoff theory and its application in surface roughness measurement by OHLIDAL, Miloslav, PRAZAK, Dominik

“…Correlation of laser speckle fields generated by light of two different wavelengths, which illuminates successively a randomly rough surface, is solved…”
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New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters by Ohlídal, Miloslav, Ohlídal, Ivan, Klapetek, Petr, Jákl, Miloš, Čudek, Vladimír, Eliáš, Marek

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SPECTRAL ANALYSIS OF METALLIC SURFACES TOPOGRAPHY GENERATED BY ABRASIVE WATERJET by Brillova, K, Ohlidal, M, Valicek, J, Kozak, D, Hloch, S, Zelenak, M, Harnicarova, M, Hlavacek, P

“…A basic study of a surface topography generated by an abrasive waterjet cutting is performed by means of the spectral analysis of these surfaces. The initial…”
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