Search Results - "Odzhaev, V. B."

Refine Results
  1. 1

    Influence of Nickel Impurity on the Operating Parameters of a Silicon Solar Cell by Kenzhaev, Z. T., Zikrillaev, N. F., Odzhaev, V. B., Ismailov, K. A., Prosolovich, V. S., Zikrillaev, Kh. F., Koveshnikov, S. V.

    Published in Russian microelectronics (2024)
    “…The research results present the influence of nickel impurities introduced by diffusion into monocrystalline silicon on the characteristics of solar cells…”
    Get full text
    Journal Article
  2. 2

    Influence of Structural Defects on the Electrophysical Parameters of pin-Photodiodes by Koval’chuk, N. S., Lastovskii, S. B., Odzhaev, V. B., Petlitskii, A. N., Prosolovich, V. S., Shestovsky, D. V., Yavid, V. Yu, Yankovskii, Yu. N.

    Published in Russian microelectronics (01-08-2023)
    “…The results of studies of electrophysical parameters of pin- silicon-based photodiodes, depending on their operating modes (external bias and temperature),…”
    Get full text
    Journal Article
  3. 3

    Attenuated Total Reflection Spectra of Nitrided SiO2/Si Structures by Odzhaev, V. B., Pyatlitski, A. N., Prosolovich, V. S., Kovalchuk, N. S., Soloviev, Ya. A., Zhygulin, D. V., Shestovsky, D. V., Yankovski, Yu. N., Brinkevich, D. I.

    Published in Journal of applied spectroscopy (01-09-2022)
    “…The behavior of nitrogen in silicon dioxide films on single-crystal silicon substrates was studied by attenuated total reflection (ATR) and time-of-flight…”
    Get full text
    Journal Article
  4. 4

    Electrophysical Parameters of PIN Photodiodes Irradiated with 60Co γ-Quanta by Kovalchuk, N. S., Lastovskii, S. B., Odzhaev, V. B., Petlitskii, A. N., Prosolovich, V. S., Shestovskii, D. V., Yavid, V. Yu, Yankovskii, Yu. N.

    Published in Russian microelectronics (2023)
    “…The results of studies of the changes in the electrophysical parameters of PIN photodiodes made on monocrystalline silicon wafers of the p -type of…”
    Get full text
    Journal Article
  5. 5

    EPR Spectroscopy of Diazoquinone–Novolac Resist Films Implanted with P+ and B+ Ions by Brinkevich, D. I., Brinkevich, S. D., Oleshkevich, A. N., Prosolovich, V. S., Odzhaev, V. B.

    Published in High energy chemistry (01-03-2020)
    “…The nature of stable radicals in FP9120 positive photoresist films implanted with boron and phosphorus ions and deposited on the surface of single-crystal…”
    Get full text
    Journal Article
  6. 6

    Effect of Process-Related Impurities on the Electrophysical Parameters of a MOS Transistor by Odzhaev, V. B., Petlitskii, A. N., Prosolovich, V. S., Filipenya, V. A., Yavid, V. Yu, Yankovskii, Yu. N.

    Published in Russian microelectronics (2021)
    “…It is established that the electrophysical characteristics of MOS transistors largely depend on the quality of a gate dielectric. The presence of an extra…”
    Get full text
    Journal Article
  7. 7

    Electronic Conductivity in a Р+-Ion Implanted Positive Photoresist by Oleshkevich, A. N., Lapchuk, N. M., Odzhaev, V. B., Karpovich, I. A., Prosolovich, V. S., Brinkevich, D. I., Brinkevich, S. D.

    Published in Russian microelectronics (2020)
    “…FP-9120 positive photoresist films 1.8 μm thick implanted with boron and phosphorus ions deposited onto the surface of KDB-10 single-crystal (111) silicon…”
    Get full text
    Journal Article
  8. 8

    Reflection Spectra Modification of Diazoquinone-Novolak Photoresist Implanted with B and P Ions by Brinkevich, D. I., Kharchenko, A. A., Prosolovich, V. S., Odzhaev, V. B., Brinkevich, S. D., Yankovskii, Yu. N.

    Published in Russian microelectronics (01-05-2019)
    “…We investigate FP9120 positive photoresist films 1.8 μm thick that are spin-coated on the surface of KDB-10 (111) silicon wafers and implanted with В + and Р +…”
    Get full text
    Journal Article
  9. 9

    Interaction between antimony atoms and micropores in silicon by Odzhaev, V. B., Petlitskii, A. N., Plebanovich, V. I., Sadovskii, P. K., Tarasik, M. I., Chelyadinskii, A. R.

    Published in Physics of the solid state (01-01-2018)
    “…The interaction between Sb atoms and micropores of a getter layer in silicon is studied. The getter layer was obtained via implantation of Sb + ions into…”
    Get full text
    Journal Article
  10. 10

    Optical Properties of Polyamide Films Modified by Implantation of Cobalt Ions by Bazarov, V. V., Bumai, Y. A., Valeev, V. F., Golovchuk, V. I., Lukashevich, M. G., Nuzhdin, V. I., Odzhaev, V. B., Kharchenko, A. A., Khaibullin, R. I.

    Published in Journal of applied spectroscopy (01-07-2020)
    “…Reflection and transmission spectra in the range 200–1100 nm of thin (40 μm) polyamide films implanted with Co + ions of energy 40 keV at ion-current density 4…”
    Get full text
    Journal Article
  11. 11

    Transmission and Reflection Spectra of Zinc Oxide Implanted with a High Dose of Cobalt Ions by Bumai, Yu. A., Valeev, V. F., Golovchuk, V. I., Gumarov, A. I., Lukashevich, M. G., Nuzhdin, V. I., Odzhaev, V. B., Kharchenko, A. A., Khaibullin, R. I.

    Published in Journal of applied spectroscopy (2020)
    “…Optical transmission and reflection spectra of monocrystalline zinc oxide (ZnO) plates implanted with 40 keV Co + ions to high doses of (0.5–1.5)·10 17 cm –2…”
    Get full text
    Journal Article
  12. 12

    Radiation-induced modification of reflection spectra beyond the ion path region in polyimide films by Brinkevich, D. I., Kharchenko, A. A., Brinkevich, S. D., Lukashevich, M. G., Odzhaev, V. B., Valeev, V. F., Nuzhdin, V. I., Khaibullin, R. I.

    “…Modification of the surface layers of polyimide films under γ-radiation and implantation with 30–100 keV Ni, Mn, Ag, Co, Fe and B ions in the dose range of 10…”
    Get full text
    Journal Article
  13. 13

    Anomalous depth distribution of Fe and Co atoms in polyimide implanted to high fluence by Popok, V.N., Khaibullin, R.I., Bazarov, V.V., Valeev, V.F., Hnatowicz, V., Mackova, A., Odzhaev, V.B.

    “…Polyimide foils were implanted with 40 keV Fe + and Co + ions to the fluences of 2.5×10 16–1.25×10 17 cm −2 at ion current densities of 4, 8 and 12 μA/cm 2…”
    Get full text
    Journal Article
  14. 14

    QUALITY ANALYSIS OF THE GATE DIELECTRIC OF THE MOS-STRUCTURES BY CAPACITY-VOLTAGE CHARACTERISTICS by V. B. Odzhaev, A. N. Pyatlitski, V. S. Prosolovich, V. A. Filipenya, S. V. Shvedau, V. V. Chernyi, V. Yu. Yavid, Yu. N. Yankouski

    Published in Pribory i metody izmererij (01-08-2015)
    “…There were investigated the capacity-voltage characteristics of the MOS transistors, fabricated by the similar process charts, with the identical applied…”
    Get full text
    Journal Article
  15. 15

    Electrical properties of polyethylene modified by multistage ion implantation by Odzhaev, V.B, Jankovsky, O.N, Karpovich, I.A, Partyka, J, Węgierek, P

    Published in Vacuum (16-08-2001)
    “…The radiation defect formation accompanied with the paramagnetic centre creation by multistage boron ion implantation into the polyamide-6 films was studied…”
    Get full text
    Journal Article Conference Proceeding
  16. 16

    Modification of magnetic properties of polyethyleneterephthalate by iron ion implantation by Lukashevich, M.G., Batlle, X., Labarta, A., Popok, V.N., Zhikharev, V.A., Khaibullin, R.I., Odzhaev, V.B.

    “…Fe+ ions (40keV) were implanted into polyethyleneterephthalate (PET) films with fluences of (0.25–1.5)×1017cm−2. Magnetic properties of the synthesised Fe:PET…”
    Get full text
    Journal Article
  17. 17

    Synthesis of Silver Nanoparticles by the Ion Implantation Method and Investigation of their Optical Properties by Popok, V. N., Stepanov, A. L., Odzhaev, V. B.

    Published in Journal of applied spectroscopy (01-03-2005)
    “…We have investigated the process of metal nanoparticle (NP) synthesis in SiO sub(2) by implanting Ag sub(+) ions with an energy of 30 keV depending on the dose…”
    Get full text
    Journal Article
  18. 18

    Magnetoresistive effect and impedance spectroscopy of Co-implanted polyimide by Popok, V. N., Lukashevich, M. G., Gorbachuk, N. I., Odzhaev, V. B., Khaibullin, R. I., Khaibullin, I. B.

    “…Electronic properties and magnetoresistance of polyimide (PI) films implanted by 40 keV Co+ ions with high fluences at various ion current densities are…”
    Get full text
    Journal Article
  19. 19

    Development of dislocation-free ion-doped silicon layers by Plebanovich, V. I., Belous, A. I., Chelyadinskiĭ, A. R., Odzhaev, V. B.

    Published in Physics of the solid state (2008)
    “…Possible suppression of the formation of residual extended defects in boron-implanted silicon is studied using a method that combines the effects of a…”
    Get full text
    Journal Article
  20. 20