Search Results - "OUACHA, H"

Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy by Chew, S. H., Gliserin, A., Schmidt, J., Bian, H., Nobis, S., Schertz, F., Kübel, M., Yang, Y.-Y., Loitsch, B., Stettner, T., Finley, J. J., Späth, C., Ouacha, H., Azzeer, A. M., Kleineberg, U.

“…A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond…”
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Laser-assisted growth of gold nanoparticles : Shaping and optical characterization by OUACHA, H, HENDRICH, C, HUBENTHAL, F, TRÄGER, F

“…We demonstrate that supported gold nanoparticles with a given well-defined shape can be produced by laser-assisted growth. For this purpose, gold nanoparticles…”
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Noise properties of an individual and two crossing multiwalled carbon nanotubes by Ouacha, H., Willander, M., Yu, H. Y., Park, Y. W., Kabir, M. S., Persson, S. H. Magnus, Kish, L. B., Ouacha, A.

“…The noise properties at room temperature of multiwalled carbon nanotubes under forward bias, for frequencies between 10 Hz–10 kHz, have been investigated. The…”
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Physico-chemical properties and alteration of Lixus historical monuments building rocks (Larache–Morocco) by Ouacha, H., Ben Moussa, A., Simao, J., El Kharim, Y., Baghdad, B.

“…This paper is a contribution to the conservation of the built heritage in Northwestern Morocco, especially the roman acheosite of Lixus in Larache. The aim is…”
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High-energy He-ion irradiation-induced defects and their influence on the noise behavior of Pd/n-Si1−xGex Schottky junctions by Mamor, M., Ouacha, H., Willander, M., Auret, F. D., Goodman, S. A., Ouacha, A., Sveinbjörnsson, E.

“…We report on the electrical properties of defects introduced by high-energy 5.4 MeV He ions in n-type strained n-SiGe and the impact of this irradiation on the…”
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1/ f noise characterization of Ir/ p -Si and Ir/ p -Si1− x Ge x low Schottky barrier junctions by Ouacha, H., Nur, O., Willander, M., Fu, Y., Ouacha, A.

“…The electrical noise properties of Ir/p-Si and Ir/p-Si1−xGex (x=0.14) Schottky junctions have been studied. The 1/f noise measurements were performed under…”
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Two abnormal peaks induced by plasma process in the noise spectra of etched Si and Si/sub 1-x/Ge/sub x by Ouacha, H., Mamor, M., Willander, M., Ouacha, A., Auret, F.D., Goodman, S.A.

“…The impact of plasma damage on the flicker noise properties of Ti/p-Si and Ti/p-Si/sub 1-x/Ge/sub x/ (with x=0.05) Schottky junctions is investigated in this…”
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