Search Results - "O'Bryan, M.V." :: Katalog Arama

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Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., LaBel, K.A., Buchner, S.P., Ladbury, R.L., Poivey, C.F., Oldham, T.R., Campola, M.J., Carts, M.A., Berg, M.D., Sanders, A.B., Mackey, S.R.

Published in 2008 IEEE Radiation Effects Data Workshop (01-07-2008)
“…We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test…”

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Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA by Cochran, D.J., Buchner, S.P., Dakai Chen, Kim, H.S., LaBel, K.A., Oldham, T.R., Campola, M.J., O'Bryan, M.V., Ladbury, R.L., Marshall, C., Sanders, A.B., Xapsos, M.A.

Published in 2009 IEEE Radiation Effects Data Workshop (01-07-2009)
“…Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include…”

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Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA by Cochran, D.J., Buchner, S.P., Sanders, A.B., LaBel, K.A., Carts, M.A., Poivey, C.F., Oldham, T.R., Ladbury, R.L., O'Bryan, M.V., Mackey, S.R.

Published in 2008 IEEE Radiation Effects Data Workshop (01-07-2008)
“…Radiation effects testing on a variety of candidate spacecraft electronics to total ionizing dose is studied. Devices tested include digital, analog, mixed…”

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Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., LaBel, K.A., Pellish, J.A., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Kim, H.S., Campola, M.J., Lauenstein, J.-M., Chen, D., Berg, M.D., Sanders, A.B., Marshall, P.W., Marshall, C.J., Xapsos, M.A., Kruckmeyer, K., Leftwich, M., Benedetto, J.M.

Published in 2009 IEEE Radiation Effects Data Workshop (01-07-2009)
“…We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test…”

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Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., Poivey, C.F., LaBel, K.A., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., Sanders, A.B., Berg, M.D., Titus, J.L.

Published in 2007 IEEE Radiation Effects Data Workshop (01-07-2007)
“…Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital,…”

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Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., Poivey, C., Kniffin, S.D., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., LaBel, K.A., Sanders, A.B., Berg, M., Marshall, C.J., Marshall, P.W., Kim, H.S., Dung-Phan, A.M., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Friendlich, M., Flanigan, R.J., Petrick, D., Powell, W., Karsh, J., Baze, M.P.

Published in 2006 IEEE Radiation Effects Data Workshop (01-07-2006)
“…Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include…”

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Recent total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J., Kniffin, S.D., Ladbury, R.L., O'Bryan, M.V., Poivey, C.F., Kim, H., Irwin, T.L., Phan, A.M., Carts, M.A., Forney, J.D., LaBel, K.A., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Howard, J.W., DiBari, R.C., Buchner, S.P., Palor, C.D.

Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”

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Recent single event effects results for candidate spacecraft electronics for NASA by O'Bryan, M.V., LaBel, K.A., Kniffin, S.D., Poivey, C., Howard, J.W., Ladbury, R.L., Buchner, S.P., Oldham, T.R., Marshall, P.W., Sanders, A.B., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Seidleck, C.M., Cox, S.R., Palor, C., Petrick, D., Powell, W., Willits, B.L.

Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
“…Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital,…”

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A roadmap for NASA's radiation effects research in emerging microelectronics and photonics by LaBel, K.A., Barnes, C.E., Marshall, P.W., Marshall, C.J., Johnston, A.H., Reed, R.A., Barth, J.L., Seidleck, C.M., Kayali, S.A., O'Bryan, M.V.

Published in 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) (2000)
“…The Electronics Radiation Characterization (ERC) project of the NASA Electronic Parts and Packaging (NEPP) Program is responsible for the radiation effects…”

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Recent radiation damage and single event effect results for microelectronics by O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Barth, J.L., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Carts, M.A., Forslund, K.E.

Published in 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) (1999)
“…We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics…”

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Current single event effects and radiation damage results for candidate spacecraft electronics by O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Jones, M.R., Sanders, A.B., Irwin, T.L., Cox, S.R., Kahric, Z.A., Palor, C.D., Sciarini, J.A.

Published in IEEE Radiation Effects Data Workshop (2002)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced…”

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Single event effects results for candidate spacecraft electronics for NASA by O'Bryan, M.V., LaBel, K.A., Howard, J.W., Poivey, C., Ladbury, R.L., Kniffin, S.D., Buchner, S.P., Xapsos, M., Reed, R.A., Sanders, A.B., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Titus, J., McMorrow, D., Li, K., Gambles, J., Stone, R.F., Patterson, J.D., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Irwin, T., Kahric, Z., Cox, S.R., Palor, C.

Published in 2003 IEEE Radiation Effects Data Workshop (2003)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested…”

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Current single event effects results for candidate spacecraft electronics for NASA by O'Bryan, M.V., Seidleck, C.M., Carts, M.A., Howard, J.W., Kim, H.S., Forney, J.D., Label, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Buchner, S.P., Oldham, T.R., Sutton, J., Irwin, T.L., Rodriguez, E., McMorrow, D., Kniffin, S.D., Ladbury, R.L., Walter, M., Palor, C., Marshall, P.W., McCall, M., Meyer, S., Lintz, J., Rodgers, J., Mohammed, S., Rapchun, D.

Published in 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) (2004)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested…”

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Radiation damage and single event effect results for candidate spacecraft electronics by O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Ladbury, R.L., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Sanders, A.B., Carts, M.A., Forney, J.D., Roth, D.R., Kinnison, J.D., Nhan, E., Sahu, K.

Published in 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) (2000)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced…”

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A compendium of recent optocoupler radiation test data by LaBel, K.A., Kniffin, S.D., Reed, R.A., Kim, H.S., Wert, J.L., Oberg, D.L., Normand, E., Johnston, A.H., Lum, G.K., Koga, R., Crain, S., Schwank, J.R., Hash, G.L., Buchner, S., Mann, J., Simpkins, L., D'Ordine, M., Marshall, C.A., O'Bryan, M.V., Seidleck, C.M., Nguyen, L.X., Carts, M.A., Ladbury, R.L., Howard, J.W.

Published in 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) (2000)
“…We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients…”

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Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J., Buchner, S.P., Irwin, T.L., Kniffin, S.D., Ladbury, R.L., Palor, C.D., LaBel, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Flanigan, R.J., Cox, S.R., O'Bryan, M.V., Carts, M.A., Poivey, C.F., Howard, J.W., Kim, H.S., Forney, J.D., Marshall, P.W.

Published in 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) (2004)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”

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Single event effect and radiation damage results for candidate spacecraft electronics by O'Bryan, M.V., LaBel, K.A., Reed, R.A., Barth, J.L., Seidleck, C.M., Marshall, P., Marshall, C., Carts, M.

Published in 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) (1998)
“…We present both heavy ion and proton single event effect (SEE) and radiation damage ground test results for candidate spacecraft electronics. Devices tested…”

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Total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA by Cochran, D.J., Kniffin, S.D., LaBel, K.A., O'Bryan, M.V., Reed, R.A., Ladbury, R.L., Howard, J.W., Poivey, C., Buchner, S.P., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Sanders, A.B., Bings, J., Seiler, J., Hall, N.E., Irwin, T., Kahric, Z., Cox, S.R., Palor, C.

Published in 2003 IEEE Radiation Effects Data Workshop (2003)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include…”

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Recent radiation damage and single event effect results for candidate spacecraft electronics by O'Bryan, M.V., LaBel, K.A., Reed, R.A., Ladbury, R.L., Howard, J.W., Buchner, S.P., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshal, C.J., Marshal, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Sanders, A.B., Cox, S.R., Dunsmore, C.J., Palor, C.

Published in 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) (2001)
“…We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced…”

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