Search Results - "Noroozian, Sh"
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The effect of methane dose and post annealing treatment on the formation of nano b-SiC buried layer in the silicon
Published in Surface & coatings technology (15-06-2009)“…Methane ions with 90 keV energy within the dose range of (0.4-4.1)x10@u1@u8 ions/cm@u2 was implanted into the silicon substrate using Kaufman ion source. The…”
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Journal Article -
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The effect of methane dose and post annealing treatment on the formation of nano β-SiC buried layer in the silicon
Published in Surface & coatings technology (15-06-2009)“…Methane ions with 90 keV energy within the dose range of (0.4–4.1) × 10 18 ions/cm 2 was implanted into the silicon substrate using Kaufman ion source. The…”
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Journal Article Conference Proceeding