Search Results - "Nofal, Issam"

Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology by Gu, Cheng, Chen, Rui, Belev, George, Shi, Shuting, Tian, Haonan, Nofal, Issam, Chen, Li

“…Single-event effects (SEEs) in integrated circuits and devices can be studied by utilizing ultra-fast pulsed laser system through Two Photon Absorption…”
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Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs by Jinhyun Noh, Correas, Vincent, Soonyoung Lee, Jongsung Jeon, Nofal, Issam, Cerba, Jacques, Belhaddad, Hafnaoui, Alexandrescu, Dan, YoungKeun Lee, Kwon, Steve

“…The assessment of the soft-error rate (SER) of semiconductor devices continues to be important, even with the adoption of FinFET devices which overcome some…”
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A Layout-Based Rad-Hard DICE Flip-Flop Design by Wang, Haibin, Dai, Xixi, Ibrahim, Younis Mohammed Younis, Sun, Hongwen, Nofal, Issam, Cai, Li, Guo, Gang, Shen, Zicai, Chen, Li

“…The DICE flip-flop has been rendered ineffective in deep-submicron technology nodes (e.g. 65 nm and 28 nm) due to charge sharing when exposed to single event…”
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Developing a Universal Mirror–mirror Laser Mapping System for Single Event Effect Research by Gu, Cheng, Belev, George, Tian, Haonan, Shi, Shuting, Nofal, Issam, Wen, Shijie, Chen, Li

“…Research on single event effects (SEEs) is significant to the design and manufacture of modern electronic devices. By applying two photon absorption (TPA)…”
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A 65 nm Temporally Hardened Flip-Flop Circuit by Li, Y.-Q, Wang, H.-B, Rui Liu, Li Chen, Nofal, Issam, Chen, Q.-Y, He, A.-L, Gang Guo, Baeg, Sang H., Shi-Jie Wen, Wong, Richard, Qiong Wu, Mo Chen

“…A guard-gate based flip-flop circuit temporally hardened against single-event effects is presented in this paper. Compared to several existed techniques, the…”
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Methods for Proton Direct Ionization SEU Characterization and Orbital Error-Rate Estimation by Glorieux, Maximilien, Bonnoit, Thierry, Lange, Thomas, Gaillard, Remi, Nofal, Issam, Artola, Laurent, Poivey, Christian, Levacq, David, Rey, Romain, Heikki, Kettunen, Polo, Cesar Boatella

“…In space environments, protons can cause single-event effects either by direct ionization or by nuclear reactions, whose secondary products deposit charges in…”
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A single event upset tolerant latch design by Wang, Haibin, Dai, Xixi, Wang, Yangsheng, Nofal, Issam, Cai, Li, Shen, Zicai, Sun, Wanxiu, Bi, Jinshun, Li, Bo, Guo, Gang, Chen, Li, Baeg, Sang

“…This paper presents a single-event-upset tolerant latch design based on a redundant structure featuring four storage nodes (i.e. Quatro). The reference…”
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Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree by Li, Yuanqing, Chen, Li, Nofal, Issam, Chen, Mo, Wang, Haibin, Liu, Rui, Chen, Qingyu, Krstic, Milos, Shi, Shuting, Guo, Gang, Baeg, Sang H., Wen, Shi-Jie, Wong, Richard

“…The soft error rate (SER) due to heavy-ion irradiation of a clock tree is investigated in this paper. A method for clock tree SER prediction is developed,…”
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EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety by Alexandrescu, Dan, Evans, Adrian, Glorieux, Maximilien, Nofal, Issam

“…Integrated circuits used in high-reliability applications must demonstrate low failure rates and high-levels of fault detection coverage. Safety Integrity…”
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