Search Results - "Niles, David W."

Understanding and Modeling the Resistance of High Aspect Ratio FIB-Fabricated Tungsten Vias by Niles, David W., Dauksher, Walter, Kee, Ronald W.

“…Tungsten vias, made with traditional focused ion beam (FIB) techniques for the purpose of circuit edit work, exhibit higher electrical resistance than expected…”
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Full-thickness Backside Circuit Editing for ASICS on Laminated Packages by Niles, David W., Kee, Ronald W., Rue, Chad

“…The traditional backside circuit editing strategy on flip chip semiconducting parts comprises approximately 30 min of de-soldering to remove the capacitors and…”
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Direct observation of Na and O impurities at grain surfaces of CuInSe2 thin films by Niles, David W., Al-Jassim, Mowafak, Ramanathan, Kannan

“…The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade…”
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CdTe Thin Films from Nanoparticle Precursors by Spray Deposition by Schulz, Douglas L, Pehnt, Martin, Rose, Doug H, Urgiles, Ed, Cahill, Andrew F, Niles, David W, Jones, Kim M, Ellingson, Randy J, Curtis, Calvin J, Ginley, David S

“…The formation of CdTe thin films by spray deposition using nanoparticle colloids has been investigated. Employing a metathesis approach, cadmium iodide is…”
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FTIR, EPMA, Auger, and XPS analysis of impurity precipitates in CdS films by Webb, J.D., Rose, D.H., Niles, D.W., Swartzlander, A., Al-Jassim, M.M.

“…Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe)…”
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Chemical reactivity of CdCl 2 wet-deposited on CdTe films studied by X-ray photoelectron spectroscopy by Niles, David W., Waters, Donna, Rose, Doug

“…The authors use X-ray photoelectron spectroscopy to investigate the chemical reactivity of CdTe films exposed to a solution of CdCl 2 dissolved in methanol…”
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The interface formation and thermal stability of Ag overlayers grown on cubic SiC(100) by Niles, David W., Höchst, Hartmut, Zajac, G. W., Fleisch, T. H., Johnson, B. C., Meese, J. M.

“…We have used photoemission spectroscopy with synchrotron radiation in the energy range hν=40–140 eV to study the interface formation of Ag overlayers on cubic…”
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Strained‐layer epitaxy of SnTe on CdTe(110) by Höchst, Hartmut, Niles, David W., Engelhardt, Michael A., Hernández‐Calderón, Isaac

“…Bulk SnTe is a IV–VI compound which crystallizes in the NaCl structure. However, deposition of SnTe on CdTe(110) can force very thin films of SnTe to grow in…”
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Na impurity chemistry in photovoltaic CIGS thin films: Investigation with x-ray photoelectron spectroscopy by Niles, David W., Ramanathan, Kannan, Hasoon, Falah, Noufi, Rommel, Tielsch, Brian J., Fulghum, Julia E.

“…Thermal processing of Cu(In 1−x Ga x ) Se 2 thin-films grown as part of photovoltaic devices on soda-lime glass leads to the incorporation of Na impurity atoms…”
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Chemical reactivity of CdCl2 wet-deposited on CdTe films studied by X-ray photoelectron spectroscopy by NILES, D. W, WATERS, D, ROSE, D

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Band offsets and interfacial properties of cubic CdS grown by molecular-beam epitaxy on CdTe(110) by NILES, D. W, HOÊCHST, H

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Strain-induced changes in the electronic valence-band structure of a cubic CdS(100) film by NILES, D. W, HÖCHST, H

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Polarization selection rules in photoemission from the valence bands of zinc-blende-structure semiconductors by NILES, D. W, RIOUX, D, HÖCHST, H

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Effect of nitric-phosphoric acid etches on material properties and back-contact formation of CdTe-based solar cells by Li, Xiaonan, Niles, David W., Hasoon, Falah S., Matson, Richard J., Sheldon, Peter

“…Forming a low-resistance contact to p -type CdTe is a critical issue for successful commercialization of CdTe-based photovoltaic devices. One solution to this…”
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Direct observation of Na and O impurities at grain surfaces of CuInSe 2 thin films by Niles, David W., Al-Jassim, Mowafak, Ramanathan, Kannan

“…The authors use field-emission Auger electron spectroscopy to investigate the spatial nature of trace Na and O impurities in thin films of photovoltaic-grade…”
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Evaporated Te on CdTe: A vacuum-compatible approach to making back contact to CdTe solar cell devices by Niles, David W., Li, Xiaonan, Albin, David, Rose, Doug, Gessert, Timothy, Sheldon, Peter

“…A commonly used process for forming low‐resistance contacts to thin‐film p‐type CdTe involves the formation of a Te layer by etching the CdTe film in a…”
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Atom and bond centered localized valence-band states in Cd0.5Zn0.5Te alloys by Niles, David W., Höchst, Hartmut

“…Angle-resolved valence-band photoemission spectroscopy is used to analyze the local electronic structure in Cd0.5Zn0.5Te(100) alloy films. Localized alloy…”
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Manifestation of electric dipole selection rules in angle resolved photoemission spectra from zinc blende semiconductors by Niles, David W., Höchst, Hartmut

“…We use angle resolved photoemission spectroscopy to determine critical point energies of the Γ7, Γ8, and X 6 levels and the valence band dispersion E(k) along…”
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Characterization of molecular‐beam epitaxially grown CdTe surfaces by high‐energy electron diffraction and synchrotron radiation photoemission spectroscopy by Hernández‐Calderón, Isaac, Niles, David W., Höchst, Hartmut

“…The homoepitaxial growth of CdTe films on CdTe(110) substrates was studied by reflection high‐energy electron diffraction (RHEED) and synchrotron radiation…”
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Determination of the bowing parameter of the split-off band in Cd 0.8 Zn 0.2 Te(100) by angle-resolved photoemission spectroscopy by Niles, David W., Höchst, Hartmut

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