Search Results - "Niewenhuis, Benjamin"

Improving structural coverage of functional tests with checkpoint signature computation by Niewenhuis, Benjamin, Varadarajan, Devanathan

“…Automotive markets place stringent demands on manufacturing test quality and in-field system test quality to ensure near zero defective parts per million…”
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Characterization of Locked Combinational Circuits via ATPG by Duvalsaint, Danielle, Jin, Xiaoxiao, Niewenhuis, Benjamin, Blanton, R. D.

“…Threats to integrated circuits exist due to the outsourcing of IC design and fabrication to third parties. As a result, various design-for-trust techniques…”
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A Logic Test Chip for Optimal Test and Diagnosis by Niewenhuis, Benjamin T

“…The benefits of the continued progress in integrated circuit manufacturing have been numerous, most notably in the explosion of computing power in devices…”
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Design reflection for optimal test-chip implementation by Blanton, R. D. Shawn, Niewenhuis, Benjamin, Liu, Zeye Dexter

“…A new type of logic characterization vehicle (LCV) that optimizes design, test, and diagnosis for yield learning has been recently described and is called the…”
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Logic characterization vehicle design reflection via layout rewiring by Fynan, Phillip, Zeye Liu, Niewenhuis, Benjamin, Mittal, Soumya, Strajwas, Marcin, Blanton, R. D. Shawn

“…Continued scaling of semiconductor fabrication processes has made achieving yield targets increasingly difficult. The design and fabrication of various types…”
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