Search Results - "Necipoglu, S."

Repetitive control of an XYZ piezo-stage for faster nano-scanning: Numerical simulations and experiments by Necipoglu, S., Cebeci, S.A., Basdogan, C., Has, Y.E., Guvenc, L.

“…A repetitive controller (RC) is implemented to control the Z-axis movements of a piezo-scanner used for AFM scanning and then tested through scan experiments…”
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Robust Repetitive Controller for Fast AFM Imaging by Necipoglu, S., Cebeci, S. A., Has, Y. E., Guvenc, L., Basdogan, C.

“…Currently, atomic force microscopy (AFM) is the most preferred scanning probe microscopy method due to its numerous advantages. However, increasing the…”
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