High Order Relaxation Methods for Co-simulation of Finite Element and Circuit Solvers

Coupled problems result in very stiff problems whose char- acteristic parameters differ with several orders in magni- tude. For such complex problems, solving them monolithi- cally becomes prohibitive. Since nowadays there are op- timized solvers for particular problems, solving uncoupled problems b...

Full description

Saved in:
Bibliographic Details
Published in:Advanced electromagnetics Vol. 9; no. 1; pp. 49 - 58
Main Authors: Nshimiyimana, J. D., Plumier, F., Ndagije, C., Gyselinck, J., Geuzain, C.
Format: Journal Article Web Resource
Language:English
Published: Advance Electromagnetics 20-03-2020
Advanced Electromagnetics
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Coupled problems result in very stiff problems whose char- acteristic parameters differ with several orders in magni- tude. For such complex problems, solving them monolithi- cally becomes prohibitive. Since nowadays there are op- timized solvers for particular problems, solving uncoupled problems becomes easy since each can be solved indepen- dently with its dedicated optimized tools. Therefore the co-simulation of the sub-problems solvers is encouraged. The design of the transmission coupling conditions between solvers plays a fundamental role. The current paper ap- plies the waveform relaxation methods for co-simulation of the finite element and circuit solvers by also investigating the contribution of higher order integration methods. The method is illustrated on a coupled finite element inductor and a boost converter and focuses on the comparison of the transmission coupling conditions based on the waveform iteration numbers between the two sub-solvers. We demon- strate that for lightly coupled systems the dynamic iterations between the sub-solvers depends much on the inter- nal integrators in individual sub-solvers whereas for tightly coupled systems it depends also to the kind of transmission coupling conditions.
Bibliography:scopus-id:2-s2.0-85082627733
ISSN:2119-0275
2119-0275
DOI:10.7716/aem.v9i1.1245