Search Results - "Nassiet, Thomas"

The Impact of Surface Voltage on Photoluminescence Response for the Detection of Copper and Iron Contamination in Silicon by Nassiet, Thomas, Duru, Romain, Le-Cunff, Delphine, Bremond, Georges, Bluet, Jean-Marie

“…Herein, silicon substrates intentionally contaminated by iron and copper are analyzed by an innovative technique based on photoluminescence (PL) measurement,…”
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Investigation of Photoluminescence Voltage PL-V Measurement: Correlation to Capacitance Voltage C-V for Si/Dielectric Interface Characterization by Nassiet, Thomas, Duru, Romain, Le-Cunff, Delphine, Arnaud, Arthur, Bluet, Jean-Marie, Bremond, Georges

“…We present an innovative approach of bias dependent photoluminescence characterization (PL-V) involving industrial Room Temperature Photoluminescence (RTPL)…”
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Characterization of Heated Ion Implantation for non Amorphizing Conditions and Correlation with Kinetic Monte Carlo Simulations by Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc

“…In this work, heated implantation impact on defect generation is observed for non-amorphizing conditions and specific anneal. Photoluminescence imaging method…”
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