Highly reliable 26nm 64Gb MLC E2NAND (Embedded-ECC & Enhanced-efficiency) flash memory with MSP (Memory Signal Processing) controller

A highly reliable 26nm 64GB MLC E2NAND (E2: Embedded-ECC & Enhanced-efficiency) flash memory has been successfully developed. To overcome scaling challenges, novel integration and operation technologies, such as 2-dummy word-line (WL) scheme, depletion suppressing process, hydrogen reducing proc...

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Bibliographic Details
Published in:	2011 Symposium on VLSI Technology - Digest of Technical Papers pp. 216 - 217
Main Authors:	Hyunyoung Shim, Seaung-Suk Lee, Byungkook Kim, Namjae Lee, Doyoung Kim, Hankyum Kim, Byungkeun Ahn, Youngho Hwang, Hoseok Lee, Jumsoo Kim, Youngbok Lee, Heeyoul Lee, Juyeab Lee, Seungho Chang, Joongseob Yang, Sungkye Park, Aritome, S., Seokkiu Lee, Kun-Ok Ahn, Gihyun Bae, Yeseok Yang
Format:	Conference Proceeding
Language:	English
Published:	IEEE 01-06-2011
Subjects:	Couplings E2NAND Error correction codes Flash memory Logic gates MLC MSP controller and reliability Reliability Signal processing Very large scale integration
Online Access:	Get full text
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Summary:	A highly reliable 26nm 64GB MLC E2NAND (E2: Embedded-ECC & Enhanced-efficiency) flash memory has been successfully developed. To overcome scaling challenges, novel integration and operation technologies, such as 2-dummy word-line (WL) scheme, depletion suppressing process, hydrogen reducing process and Virtual Negative Read (VNR) scheme are introduced. And also, Memory Signal Processing (MSP) controller is used for enhancing performance and reliability. Finally, 5K cycling and 1 year data retention can be greatly achieved.
ISBN:	9781424499496 1424499496
ISSN:	0743-1562