Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films
[Display omitted] •Pyrochlore phase crystallizes near the bottom film-electrode interface.•PLZT films show a non-uniform microstrain and crystallite size in depth profile.•Complex grainy structure leads to different elastic modulus at the nanoscale. Polycrystalline lead lanthanum zirconate titanate...
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Published in: | Materials research bulletin Vol. 61; pp. 26 - 31 |
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Main Authors: | , , , , , , , |
Format: | Journal Article |
Language: | English |
Published: |
United States
Elsevier Ltd
01-01-2015
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Subjects: | |
Online Access: | Get full text |
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Summary: | [Display omitted]
•Pyrochlore phase crystallizes near the bottom film-electrode interface.•PLZT films show a non-uniform microstrain and crystallite size in depth profile.•Complex grainy structure leads to different elastic modulus at the nanoscale.
Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale. |
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ISSN: | 0025-5408 1873-4227 |
DOI: | 10.1016/j.materresbull.2014.09.055 |