Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films

[Display omitted] •Pyrochlore phase crystallizes near the bottom film-electrode interface.•PLZT films show a non-uniform microstrain and crystallite size in depth profile.•Complex grainy structure leads to different elastic modulus at the nanoscale. Polycrystalline lead lanthanum zirconate titanate...

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Bibliographic Details
Published in:Materials research bulletin Vol. 61; pp. 26 - 31
Main Authors: Araújo, E.B., Nahime, B.O., Melo, M., Dinelli, F., Tantussi, F., Baschieri, P., Fuso, F., Allegrini, M.
Format: Journal Article
Language:English
Published: United States Elsevier Ltd 01-01-2015
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Summary:[Display omitted] •Pyrochlore phase crystallizes near the bottom film-electrode interface.•PLZT films show a non-uniform microstrain and crystallite size in depth profile.•Complex grainy structure leads to different elastic modulus at the nanoscale. Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.
ISSN:0025-5408
1873-4227
DOI:10.1016/j.materresbull.2014.09.055