Search Results - "Nachlas, J.A."

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  1. 1

    Availability Analysis for the Quasi-Renewal Process by Rehmert, I.J., Nachlas, J.A.

    “…Historically, the behaviors of repairable systems were usually modeled under the assumption that repair implied system renewal. Availability functions were…”
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    Journal Article
  2. 2

    Bivariate reliability and availability modeling by Sang-Chin Yang, Nachlas, J.A.

    Published in IEEE transactions on reliability (01-03-2001)
    “…Equipment longevity is a resource that is consumed in device operation. For many types of equipment, the resource can be reasonably represented in terms of two…”
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    Journal Article
  3. 3

    Diagnostic-strategy selection for series systems by Nachlas, J.A., Loney, S.R., Binney, B.A.

    Published in IEEE transactions on reliability (01-08-1990)
    “…The selection of efficient testing strategies for repairable systems composed of components arranged in series is considered. Two cost models (for perfect and…”
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    Journal Article
  4. 4

    Availability under Age Replacement with Distinct Service Time Distributions by Murdock, W.P.Jr, Nachlas, J.A.

    “…In this paper, we construct a model for the case in which the probability distributions for the durations of corrective maintenance and of preventive…”
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    Conference Proceeding
  5. 5

    Use of nested renewals to model availability under opportunistic maintenance policies by Degbotse, A.T., Nachlas, J.A.

    “…The idea of nested renewal processes is used to define availability models for equipment subjected to age-based opportunistic preventive maintenance policies…”
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    Conference Proceeding
  6. 6

    Comments on "Diagnostic-strategy selection for a series system" by J.A. Nachlas et al by Canfield, R.V., Nachlas, J.A.

    Published in IEEE transactions on reliability (01-06-1991)
    “…The authors comment on the work of J.A. Nachlas et al. (see ibid., vol.39, no.3, p.273-80, 1990) that presents diagnostic strategies for series systems with…”
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    Journal Article
  7. 7

    Coordinated warranty and burn-in strategies by Kar, T.R., Nachlas, J.A.

    Published in IEEE transactions on reliability (01-12-1997)
    “…In product reliability assurance, the warranty and burn-in (W&BI) strategies are usually selected separately, despite the fact that both depend on the…”
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    Journal Article
  8. 8

    Bivariate failure modeling by Sang-Chin Yang, Kobza, J.E., Nachlas, J.A.

    “…Issues related to the construction of bivariate reliability models and their application to maintenance planning are discussed. The distinction between…”
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    Conference Proceeding
  9. 9

    The frequency distribution of availability by Cassady, C.R., Nachlas, J.A.

    “…Availability is probably the most informative indicator of performance for repairable devices. The construction and study of availability measures is usually…”
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    Conference Proceeding
  10. 10

    Comprehensive fleet maintenance management by Cassady, C.R., Murdock, W.P., Nachlas, J.A., Pohl, E.A.

    “…A determining factor in efficient use of fleets of equipment is effective maintenance planning. Managing the maintenance of a fleet of equipment is a complex…”
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    Conference Proceeding Journal Article
  11. 11

    Reliability estimation using doubly-censored field data by Nachlas, J.A., Kumar, A.

    Published in IEEE transactions on reliability (01-06-1993)
    “…A frequently encountered problem in reliability verification is described, and several approaches to managing this problem are presented. The general problem…”
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    Journal Article
  12. 12

    Microelectronic reliability predictions derived from component defect densities by Stevenson, J.L., Nachlas, J.A.

    “…A physics-of-failure approach to reliability prediction for integrated circuits is discussed. The analysis described is based upon the expectation that no…”
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    Conference Proceeding
  13. 13

    Hazard-function implications of stochastic-deterioration and distributed-defect concentrations by Nachlas, J.A., Cassady, C.R., Rooney, K.F.

    “…Two candidate models of the relationship between the initial defect concentration in a population of integrated circuit (IC) devices and the associated life…”
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    Conference Proceeding Journal Article
  14. 14

    Sensitivity in Weibull System Reliability Models by Nachlas, J.A., Gruber, S.S., Wiesel, H.Z.

    “…Sensitivity of a Weibull distribution based model of complex-system reliability is investigated analytically and numerically. The complex system modeled is a…”
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    Conference Proceeding