Search Results - "NURMELA, A"

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    Influence of the seed layer on structural and electro-acoustic properties of sputter-deposited AlN resonators by Riekkinen, T., Nurmela, A., Molarius, J., Pensala, T., Kostamo, P., Ylilammi, M., van Dijken, S.

    Published in Thin solid films (30-10-2009)
    “…The growth of high-quality AlN films has been studied by reactive sputtering onto Mo electrodes with Ni, Ti, and TiW seed layers and subsequent integration…”
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    Journal Article
  3. 3

    Alpha–proton elastic scattering cross sections for ERDA in the resonance region by Pusa, P, Rauhala, E, Gurbich, A, Nurmela, A

    “…We have investigated alpha–proton elastic scattering for He-ERDA. The broad maximum of the elastic scattering resonance around E He=8.8 MeV is most important…”
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    Journal Article
  4. 4

    Stress control of sputter-deposited Mo-N films for micromechanical applications by KATTELUS, H, KOSKENALA, J, NURMELA, A, NISKANEN, A

    Published in Microelectronic engineering (2002)
    “…Sputter-deposited metallic thin films are attractive materials for micromechanics but they suffer from large stress variations within the batch or even a…”
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    Conference Proceeding Journal Article
  5. 5

    Ion beam studies of hydrogen implanted Si wafers by Nurmela, A., Henttinen, K., Suni, T., Tolkki, A., Suni, I.

    “…We have studied silicon-on-insulator (SOI) materials with two different ion beam analysis methods. The SOI samples were implanted with boron and hydrogen ions…”
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    Journal Article
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    Influence of hydrogen dose and boron doping on the ion cutting of Si by Nurmela, A., Henttinen, K., Suni, T., Suni, I.

    Published in Surface and interface analysis (01-09-2003)
    “…Ion beam techniques were used to study silicon‐on‐insulator (SOI) structures manufactured by the ion cutting process. Silicon wafers and epitaxial Si layers…”
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    Journal Article Conference Proceeding
  7. 7

    Cold ion-cutting of hydrogen implanted Si by Henttinen, K., Suni, T., Nurmela, A., Suni, I., Lau, S.S., Höchbauer, T., Nastasi, M., Airaksinen, V.-M.

    “…The strength of the H-implanted layer has been measured in 〈1 0 0〉 , 〈1 1 1〉 and 〈1 1 0〉 oriented Si wafers using the crack opening method. The required…”
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    Journal Article
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    RBS and ERD cross-sections and optical model parameters for the analysis of lithium, boron and nickel by Nurmela, A, Pusa, P, Rauhala, E, Räisänen, J

    “…Elastic scattering cross-sections for RBS analysis of nickel by 7 Li and 11 B ion backscattering near the Coulomb barrier have been determined. The lithium ion…”
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    Journal Article
  9. 9

    Transfer of thin Si layers by cold and thermal ion cutting by HENTTINEN, K, SUNI, T, NURMELA, A, LUOTO, H. V. A, SUNI, I, AIRAKSINEN, V.-M, KARIRINNE, S, CAI, M, LAU, S. S

    “…We have used the crack-opening method to study the mechanical exfoliation behavior in hydrogen-implanted and bonded Cz Si. We found that the crystal…”
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    Conference Proceeding Journal Article
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    Elastic scattering cross sections for 6Li and 7Li scattering by aluminum, silicon and titanium below 12 MeV at angles of 140 ∘ and 170 by Nurmela, A, Rauhala, E, Räisänen, J

    “…Elastic scattering cross sections for 6Li and 7Li scattering by natural aluminum, silicon and titanium have been measured in the energy range of 4–11 MeV…”
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    Journal Article
  13. 13

    Reactive sputter deposition and properties of Ta sub(x)N thin films by Molarius, J, Laurila, T, Nurmela, A, Suni, I, Kivilahti, J K, Riekkinen, Tommi

    Published in Microelectronic engineering (01-10-2002)
    “…The aim of this work was to evaluate tantalum nitride thin films fabricated using reactive sputtering with adjusted deposition parameters. Thin Ta sub(x)N…”
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    Journal Article
  14. 14

    Elastic scattering cross sections for the analysis of helium by 1H backscattering and hydrogen by 4He ERD by Nurmela, A., Räisänen, J., Rauhala, E.

    “…Elastic scattering cross sections for the analysis of helium by proton backscattering have been determined in the energy region 1.6–2.7 MeV. The measurements…”
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    Journal Article
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    Reactive sputter deposition and properties of Ta xN thin films by Riekkinen, T, Molarius, J, Laurila, T, Nurmela, A, Suni, I, Kivilahti, J.K

    Published in Microelectronic engineering (2002)
    “…The aim of this work was to evaluate tantalum nitride thin films fabricated using reactive sputtering with adjusted deposition parameters. Thin Ta x N films…”
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    Journal Article
  16. 16

    Transfer of thin Si layers by cold and thermal ion cutting by Henttinen, K, Suni, T, Nurmela, A, Luoto, H V A, Suni, I, Airaksinen, V.-M., Karirinne, S, Cai, M, Lau, S S

    “…We have used the crack-opening method to study the mechanical exfoliation behavior in hydrogen-implanted and bonded Cz Si. We found that the crystal…”
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    Journal Article
  17. 17

    Nonlinear effects in solidly-mounted ZnO BAW resonators by Nurmela, A., Salminen, H., Mattila, T., Ylilammi, M.

    Published in 2008 IEEE Ultrasonics Symposium (01-11-2008)
    “…The mechanical nonlinearity due to high power level in zinc oxide thin film bulk acoustic wave resonators has been studied in this work. The nonlinear behavior…”
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    Conference Proceeding
  18. 18

    Piezoelectrically transduced single-crystal-silicon plate resonators by Jaakkola, A., Rosenberg, P., Asmala, S., Nurmela, A., Pensala, T., Riekkinen, T., Dekker, J., Mattila, T., Alastalo, A., Holmgren, O., Kokkonen, K.

    Published in 2008 IEEE Ultrasonics Symposium (01-11-2008)
    “…We report on the design, fabrication and characterization of piezoelectrically actuated single-crystal silicon plate resonators vibrating mainly in their bulk…”
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    Conference Proceeding
  19. 19

    P2G-3 Piezotransduced Single-Crystal Silicon BAW Resonators by Jaakkola, A., Rosenberg, P., Nurmela, A., Pensala, T., Riekkinen, T., Dekker, J., Mattila, T., Alastalo, A.

    “…We report on the design, fabrication and measurement of 13-MHz piezoelectrically actuated single-crystal silicon beam resonators operating in the first…”
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    Conference Proceeding
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    Piezoelectrically actuated micromechanical BAW resonators by Rosenberg, P., Jaakkola, A., Dekker, J., Nurmela, A., Pensala, T., Asmala, S., Riekkinen, T., Mattila, T., Alastalo, A.

    Published in 2008 IEEE Ultrasonics Symposium (01-11-2008)
    “…We report on piezoelectrically actuated 13 MHz silicon beam resonators operating in the fundamental length extensional BAW mode. The resonance is evoked using…”
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    Conference Proceeding