Incidence of multilayers in chemically exfoliated graphene

Scientific Reports 9, 19480 (2019) An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the...

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Bibliographic Details
Main Authors:	Szirmai, P, Márkus, B. G, Chacón-Torres, J. C, Eckerlein, P, Edelthalhammer, K, Englert, J. M, Mundloch, U, Hirsch, A, Hauke, F, Náfrádi, B, Forró, L, Kramberger, C, Pichler, T, Simon, F
Format:	Journal Article
Language:	English
Published:	17-01-2019
Subjects:	Physics - Mesoscale and Nanoscale Physics Physics - Strongly Correlated Electrons
Online Access:	Get full text
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Summary:	Scientific Reports 9, 19480 (2019) An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to determine the distribution of the number of graphene layers in chemically exfoliated graphene. We utilize a controlled vapor-phase potassium intercalation technique and identify a lightly doped stage, where the Raman modes of undoped and doped few-layer graphene flakes coexist. The spectra can be unambiguously distinguished from alkali doped graphite, and a modeling with the distribution of the layers yields an upper limit of flake thickness of five layers with a significant single-layer graphene content. Complementary statistical AFM measurements on individual few-layer graphene flakes find a consistent distribution of the layer numbers.
DOI:	10.48550/arxiv.1807.09329