Search Results - "Muhamedsalih, Hussam"

Surface and thickness measurement of a transparent film using wavelength scanning interferometry by Gao, Feng, Muhamedsalih, Hussam, Jiang, Xiangqian

“…A wavelength scanning interferometer for measuring the surface and thickness of a transparent film has been studied. A halogen light source combined with an…”
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Carré Phase Shifting Algorithm for Wavelength Scanning Interferometry by Muhamedsalih, Hussam, Tang, Dawei, Kumar, Prashant, Jiang, Xiangqian

“…Wavelength scanning interferometry is an interferometric technique for measuring surface topography without the well-known 2π phase ambiguity limitation. The…”
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Implementation of in Process Surface Metrology for R2R Flexible PV Barrier Films by Elrawemi, Mohamed, Blunt, Liam, Muhamedsalih, Hussam, Gao, Feng, Fleming, Leigh

“…Thin functional barrier layers of aluminum oxide (Al 2 O 3 ) that are used particularly in photovoltaic (PV) modules to prevent the possibility of water vapor…”
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Chromatic focus variation microscopy for surface metrology by Mustafa, Aalim M., Muhamedsalih, Hussam, Tang, Dawei, Kumar, Prashant, Jiang, Jane

“…Optical metrology plays a vital role in a wide range of research and inspection areas in the industry. At present, the market offers a variety of optical…”
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Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces by Lou, Shan, Tang, Dawei, Zeng, Wenhan, Zhang, Tao, Gao, Feng, Muhamedsalih, Hussam, Jiang, Xiangqian, Scott, Paul J.

“…In comparison to tactile sensors, optical techniques can provide a fast, nondestructive profile/areal surface measurement solution. Nonetheless, high…”
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Investigation of wavelength scanning interferometry for embedded metrology by Muhamedsalih, Hussam

“…The tremendous growth in the manufacture of a wide range of deterministic and complex free form surfaces, has made surface metrology an essential part of the…”
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Areal surface measurement using chromatic focus variation by Mustafa, Aalim M., Muhamedsalih, Hussam, Tang, Dawei, Kumar, Prashant, Jiang, Jane

“…Optical metrology is an essential measurement technology across various research and inspection domains. Focus variation instruments are widely used in the…”
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