Search Results - "Moya, Gérard"

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    Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy by Si Ahmed, A., Kansy, J., Zarbout, K., Moya, G., Liebault, J., Gœuriot, D.

    “…The dielectric breakdown strengths of two series of sintered alumina samples of low and high impurity content (with Si being the dominant element) and single…”
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    Journal Article Conference Proceeding
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