Search Results - "Mounir Mahmoud, M."

Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology by Mounir Mahmoud, M., Prinzie, J., Soderstrom, D., Niskanen, K., Pouget, V., Cathelin, A., Clerc, S., Leroux, P.

“…Integrated circuits (ICs) are a keystone for most critical applications operating in high-level radiation environments, spanning from high-energy nuclear…”
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UTBB FD-SOI Variability Characterization Using Programmable Transistor Arrays by Mahmoud, M. Mounir, Prinzie, J., Belie, A. Adebabay, De Raedemaeker, S., Leroux, P.

“…Intensive CMOS scaling is a significant factor for achieving superior performance. However, this scaling has an enormous negative effect on the circuit…”
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Design Framework to Overcome Aging Degradation of the 16 nm VLSI Technology Circuits by Mounir Mahmoud, M., Soin, Norhayati, Fahmy, Hossam A. H.

“…Intensive scaling for VLSI circuits is a key factor for gaining outstanding performance. However, this scaling has huge negative impact on the circuit…”
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