Search Results - "Molina, S.I"
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Materials with enhanced adhesive properties based on acrylonitrile-butadiene-styrene (ABS)/thermoplastic polyurethane (TPU) blends for fused filament fabrication (FFF)
Published in Materials & design (15-11-2019)“…In the current work, we prepared a novel material suitable for additive manufacturing by using acrylonitrile-butadiene-styrene (ABS) copolymer as matrix and a…”
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Low dose electron tomography of novel nanocomposites for additive manufacturing
Published in Polymer testing (01-11-2023)“…The development of new nanocomposites with added functionalities for Additive Manufacturing (AM) requires of a deep understanding of the 3D distribution of the…”
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Structural and chemical characterization of CdSe-ZnS core-shell quantum dots
Published in Applied surface science (01-11-2018)“…[Display omitted] •Photoluminescence and quantum yield of CdSe QDs are greatly improved when covered by ZnS shell.•The synthesis by hot injection and SILAR…”
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Column-by-column compositional mapping by Z-contrast imaging
Published in Ultramicroscopy (2009)“…A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of…”
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5
Extreme voltage recovery in GaAs:Ti intermediate band solar cells
Published in Solar energy materials and solar cells (01-01-2013)“…Intermediate band materials incorporate a collection of energy levels with special optoelectronic properties within the semiconductor bandgap. This feature…”
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Growth of III-nitrides on Si(1 1 1) by molecular beam epitaxy Doping, optical, and electrical properties
Published in Journal of crystal growth (01-05-1999)“…The growth of high-quality III-nitrides by plasma-assisted molecular beam epitaxy on Si(1 1 1) substrates is addressed. A combination of optimized AlN buffer…”
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Structural characterization of GaSb-capped InAs/GaAs quantum dots with a GaAs intermediate layer
Published in Materials letters (15-06-2011)“…GaSb incorporation to InAs/GaAs quantum dots is considered for improving the opto-electronic properties of the systems. In order to optimize these properties,…”
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Degradation of thermoplastic polymers for fused filament fabrication under (S)TEM electron beam irradiation
Published in Polymer degradation and stability (01-12-2024)“…•Electron degradation of four thermoplastics during STEM-EELS analyses is investigated.•Polymers degradation occur to a larger extent at the beginning of…”
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A sugar-beet waste based thermoplastic agro-composite as substitute for raw materials
Published in Journal of cleaner production (01-06-2020)“…The creation of plastic composites allows tuning the polymer properties in order to reach the desired performance for many different applications. Within this…”
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10
Induced damage during STEM-EELS analyses on acrylic-based materials for Stereolithography
Published in Polymer degradation and stability (01-09-2022)“…•The degradation mechanism of acrylic resins during STEM-EELS analyses is investigated.•Mass loss and compositional changes are demonstrated during electron…”
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Investigation of AlInAsSb/GaSb tandem cells – A first step towards GaSb-based multi-junction solar cells
Published in Solar energy materials and solar cells (01-01-2021)“…III-Sb semiconductors cover the whole 0.29–1.64 eV bandgap range, allowing us to grow several subcells of a multi-junction solar cell lattice-matched to GaSb…”
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12
Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging
Published in Ultramicroscopy (01-11-2014)“…In this work we examined MoS2 sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200kV…”
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Quality improvement of AlInN/p-Si heterojunctions with AlN buffer layer deposited by RF-sputtering
Published in Journal of alloys and compounds (15-11-2018)“…The effect of an AlN buffer layer thickness on the structural, morphological and optical properties of n- Al0.37In0.63N deposited on p-Si (111) by…”
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Gaussian kernel density functions for compositional quantification in atom probe tomography
Published in Materials characterization (01-05-2018)“…Atom probe tomography (APT) has the ability to identify the nature and position of single atoms in a material with an almost 3D atomic resolution. However, the…”
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MBE growth of GaN and AlGaN layers on Si(1 1 1) substrates: doping effects
Published in Journal of crystal growth (01-05-1999)“…High-quality GaN layers with 8 arcmin (X-ray diffraction full-width at half-maximum, XRD FWHM) and rms surface roughness of 57 Å are grown on Si(1 1 1)…”
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Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells
Published in Journal of alloys and compounds (05-07-2019)“…In this work, the effect of thermal annealing under As overpressure in the composition distribution of In8Al42As34.5Sb15.5 layers, lattice matched to InP for…”
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Electron microscopy study of SiC obtained by the carbonization of Si(111)
Published in Thin solid films (01-04-1999)“…A SiC thin film grown by propane carbonization of a Si(111) substrate has been characterized by transmission electron microscopy and scanning electron…”
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Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
Published in Journal of alloys and compounds (30-09-2018)“…The composition distribution of In0.16Al0.34As0.41Sb0.09 layers grown at different temperatures with applications in solar cells have been analysed by atom…”
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Effect of an in-situ thermal annealing on the structural properties of self-assembled GaSb/GaAs quantum dots
Published in Applied surface science (15-02-2017)“…[Display omitted] •GaSb QDs are more elongated and Sb is less concentrated after the thermal annealing.•The density of misfit dislocations in GaSb QDs is…”
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20
Influence of the crosstalk on the intensity of HAADF‐STEM images of quaternary semiconductor materials
Published in Journal of microscopy (Oxford) (01-01-2019)“…Summary The influence of the neighbouring atomic‐columns in determining the composition at atomic column scale of quaternary semiconductor compounds, using…”
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