Search Results - "Mitch Wallis, T."

Imaging of magnetic excitations in nanostructures with near-field microwave microscopy by Berweger, Samuel, Tyrell-Ead, Robert, Chang, Houchen, Wu, Mingzhong, Zhu, Na, Tang, Hong X., Nembach, Hans, Karl Stupic, T., Russek, Stephen, Mitch Wallis, T., Kabos, Pavel

“…We present images of spin-wave excitations in a patterned yttrium iron garnet (YIG) thin film obtained by use of near-field microwave microscopy, which can…”
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Broadband Electrical Characterization of Multiwalled Carbon Nanotubes and Contacts by Rice, Paul, Wallis, T. Mitch, Russek, Stephen E, Kabos, Pavel

“…The electrical response of an individual multiwalled carbon nanotube (MWNT) and its contacts, welded to a coplanar waveguide (CPW), was measured up to 24 GHz…”
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Magneto-mechanical investigation of spin dynamics in magnetic multilayers by Lim, Sang-Hyun, Imtiaz, Atif, Mitch Wallis, T., Russek, Stephen, Kabos, Pavel, Cai, Liufei, Chudnovsky, Eugene M.

“…The Einstein-de Haas effect is used to study experimentally the interfacial spin transport in a bilayer metallic system. Specifically, mechanical torque on a…”
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Micromachined resonators of high Q-factor based on atomic layer deposited alumina by Chang, Yuan-Jen, Gray, Jason M., Imtiaz, Atif, Seghete, Dragos, Mitch Wallis, T., George, Steven M., Kabos, Pavel, Rogers, Charles T., Bright, Victor M.

“…In this paper, atomic layer deposited (ALD) alumina (Al 2O 3) has been demonstrated as the structural material for a micro-resonator for the first time. An…”
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Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors by Berweger, Samuel, Qiu, Gang, Wang, Yixiu, Pollard, Benjamin, Genter, Kristen L, Tyrrell-Ead, Robert, Wallis, T. Mitch, Wu, Wenzhuo, Ye, Peide D, Kabos, Pavel

“…The development of van der Waals (vdW) homojunction devices requires materials with narrow bandgaps and simultaneously high hole and electron mobilities for…”
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Asymmetric Dielectric Trilayer Cantilever Probe for Calorimetric High-Frequency Field Imaging by Lee, S., Wallis, T.M., Moreland, J., Kabos, P., Lee, Y.C.

“…Multimaterial, microelectromechanical systems-based cantilever probes were developed for high-frequency magnetic field imaging. The basic configuration of the…”
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Influence of Periodic Patterning on the Magnetization Response of Micromagnetic Structures by Sang-Hyun Lim, Wallis, T Mitch, Imtiaz, Atif, Dazhen Gu, Krivosik, Pavol, Kabos, Pavel

“…The magnetization response of single, patterned, thin-film Permalloy (Ni_80Fe_20, Py) elements embedded in a coplanar waveguide (CPW) is investigated. The…”
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Electrical Characterization of Photoconductive GaN Nanowires from 50 MHz to 33 GHz by Wallis, T. M., Dazhen Gu, Imtiaz, A., Smith, C. S., Chin-Jen Chiang, Kabos, P., Blanchard, P. T., Sanford, N. A., Bertness, K. A.

“…The electrical response of two-port photoconductive GaN nanowire devices was measured from 50 MHz to 33 GHz. The admittance of the nanowire devices showed an…”
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Modeling and metrology of metallic nanowires with application to microwave interconnects by Kichul Kim, Wallis, T Mitch, Rice, Paul, Chiang, Chin-Jen, Imtiaz, Atif, Kabos, Pavel, Filipovic, Dejan S

“…Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling…”
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An overview of measurement techniques for radio frequency nanotechnology (Invited paper) by Wallis, T. Mitch, Kabos, Pavel

“…We present an overview of the historical development and current state-of-the-art in measurement techniques for radio frequency (RF) nanotechnology. The field…”
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Metrology of microstructured waveguides for spintronic applications by Sang-Hyun Lim, Wallis, T Mitch, Imtiaz, A, Dazhen Gu, Krivosik, P, Kabos, P

“…Patterned permalloy films embedded in a coplanar waveguide (CPW) were fabricated, and the magnetization dynamics of such structures were investigated…”
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Near-field antenna as a Scanning Microwave Probe for characterization of materials and devices by Imtiaz, Atif, Wallis, T Mitch, Lim, Sang H, Chisum, Jonathan, Popovic, Zoya, Kabos, Pavel

“…The Scanning Microwave Probe (SMP) is emerging as an important broadband metrology tool for characterizing materials and devices in the micron and sub-micron…”
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A Framework for Broadband Characterization of Individual Nanowires by Kichul Kim, Wallis, T.M., Rice, P., Chin-Jen Chiang, Imtiaz, A., Kabos, P., Filipovic, D.S.

“…A framework for broadband characterization of individual nanowires (NWs) is discussed in this letter. Specifically, on-wafer multiline thru-reflect-line (TRL)…”
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High-Frequency Characterization of Contact Resistance and Conductivity of Platinum Nanowires: Special Issue on Radio-Frequency Nanoelectronics by KIM, Kichul, MITCH WALLIS, T, RICE, Paul, DAZHEN GU, LIM, Sang-Hyun, IMTIAZ, Atif, KABOS, Pavel, FILIPOVIC, Dejan S

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High-Frequency Characterization of Contact Resistance and Conductivity of Platinum Nanowires by Kichul Kim, Wallis, T. M., Rice, P., Dazhen Gu, Sang-Hyun Lim, Imtiaz, A., Kabos, P., Filipovic, D. S.

“…Contact resistance and conductivity of individual platinum (Pt) nanowires (NWs) embedded in coplanar waveguide structures are investigated at high frequencies…”
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Near-field microwave microscopy of one-dimensional nanostructures by Berweger, Samuel, Blanchard, Paul T., Quardokus, Rebecca C., DelRio, Frank W., Wallis, T. Mitch, Kabos, Pavel, Krylyuk, Sergiy, Davydov, Albert V.

“…With the ability to measure sample conductivity with nanometer spatial resolution, scanning microwave microscopy (SMM) is a powerful tool to study nanoscale…”
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Looking Forward to IMS 2022 by Wallis, T Mitch

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Looking Forward to IMS2022 by Wallis, T. Mitch

“…As guest editor, it's my pleasure to welcome you to this issue of IEEE Microwave Magazine . This issue focuses on the 2022 IEEE Microwave Theory and Techniques…”
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Nanoelectronic Characterization: Using Near-Field Microwave Microscopy for Nanotechnological Research by Berweger, Samuel, Wallis, T. Mitch, Kabos, Pavel

“…The optical characterization of nanoscale objects is challenging due to the Abbe diffraction limit. This limit constrains the achievable spatial resolution of…”
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Microwaves and Microscopy [From the Guest Editors' Desk] by Farina, Marco, Wallis, T. Mitch

“…The articles in this special section focus on microwaves and microscopy. As the phrase implies, the topic lies at the intersection of two technical…”
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