Search Results - "Mistrík, J."

Combined Au/Ag nanoparticle creation in ZnO nanopillars by ion implantation for optical response modulation and photocatalysis by Macková, A., Jagerová, A., Lalik, O., Mikšová, R., Poustka, D., Mistrík, J., Holý, V., Schutter, J.D., Kentsch, U., Marvan, P., Azarov, A., Galeckas, A.

“…[Display omitted] •Ag, Au-nanoparticles were embedded into ZnO nanopillars by ion implantation.•Nanoparticles exhibited extraordinary optical absorbance in a…”
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Properties of Au nanolayer sputtered on polyethyleneterephthalate by Švorčík, V., Kolská, Z., Luxbacher, T., Mistrík, J.

“…AFM, XRD, zeta ( ζ) potential measurement and spectroscopic ellipsometry were used for characterization of thin (20 nm) Au films sputtered onto…”
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Annealing of gold nanostructures sputtered on glass substrate by Švorčík, V., Siegel, J., Šutta, P., Mistrík, J., Janíček, P., Worsch, P., Kolská, Z.

“…The effects of annealing at 300 °C on gold nanostructures sputtered onto glass substrate were studied using XRD, SAXSees, the Van der Pauw method and…”
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Magneto-optical Faraday and Kerr effect of orthoferrite thin films at high temperatures by KELLER, N, MISTRIK, J, VISNOVSKY, S, SCHMOOL, D. S, DUMONT, Y, RENAUDIN, P, GUYOT, M, KRISHNAN, R

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Spectroscopic ellipsometry characterization of nano-crystalline diamond films prepared at various substrate temperatures and pulsed plasma frequencies using microwave plasma enhanced chemical vapor deposition apparatus with linear antenna delivery by Mistrik, J., Janicek, P., Taylor, A., Fendrych, F., Fekete, L., Jager, A., Nesladek, M.

“…A series of nanocrystalline diamond (NCD) films were deposited by a custom made microwave plasma enhanced chemical vapor deposition apparatus with linear…”
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Magnetic, Optical and Magneto-Optical Properties of Fe-Monolayer from First Principles by KUNE, J, MISTRIK, J

“…Thin film magnetic systems have recently attracted much attention of experimental and computational physicists. In the present paper magnetic, optical and…”
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Multilayer and functionally gradient films of plasma polymers intended as compatible interlayers for hybrid materials by Hoferek, L., Mistrik, J., Trivedi, R., Chen, K.S., Perina, V., Cech, V.

“…Complex film structures, such as multilayer and gradient films, were deposited using tetravinylsilane monomer by plasma-enhanced chemical vapor deposition. The…”
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Magneto-optical spectroscopy of [αFe2O3/NiO]2.5 multilayers and NiFe2O4 films by Mistrı́k, J, Lopušnı́k, R, Višňovský, Š, Keller, N, Guyot, M, Krishnan, R

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Self-Assembled Monolayers of Vinyltriethoxysilane and Vinyltrichlorosilane Deposited on Silicon Dioxide Surfaces by Babik, A., Mistrik, J., Zemek, J., Cech, V.

“…This study was aimed at deposition of self-assembled monolayers (SAMs) using vinyltriethoxysilane (VTES) and vinyltrichlorosilane (VTCS) molecules chemisorbed…”
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Correlation between mechanical, optical and chemical properties of thin films deposited by PECVD by Cech, V., Studynka, J., Cechalova, B., Mistrik, J., Zemek, J.

“…Plasma-polymerized films of vinyltriethoxysilane were prepared by plasma-enhanced chemical vapor deposition using an RF (13.56 MHz) helical coupling plasma…”
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Optical measurements of silicon wafer temperature by Postava, K., Aoyama, M., Mistrik, J., Yamaguchi, T., Shio, K.

“…An optical technique for precise, non-contact, and real time measurement of silicon wafer temperature that uses the polarized reflectivity ratio R p / R s is…”
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Near infrared quazi-omnidirectional reflector in chalcogenide glasses by Kohoutek, T., Orava, J., Prikryl, J., Mistrik, J., Wagner, T., Frumar, M.

“…The quazi-omnidirectional reflector was designed as a planar quarter wave stack consisting of the alternating amorphous chalcogenide Ge 25S 75 and Sb 40Se 60…”
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Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films by Mistrik, J., Cechalova, B., Studynka, J., Cech, V.

“…Plasma-polymerised vinyltriethoxysilane (pp-VTES) films with thicknesses ranging from 20 nm to about 5 μm were studied by combined method of spectroscopic…”
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Magneto-optical spectroscopy on permalloy wires in 0th and 1st diffraction orders by Antos̆, R, Mistrı́k, J, Aoyama, M, Yamaguchi, T, Vis̆n̆ovský, S̆, Hillebrands, B

“…The optical and magneto-optical spectroscopy has been used for experimental studies of Ni 81Fe 19 nanowires. The measured spectra of 0th and 1st reflected…”
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Spectroscopic ellipsometry on lamellar gratings by Antos, R., Ohlidal, I., Mistrik, J., Murakami, K., Yamaguchi, T., Pistora, J., Horie, M., Visnovsky, S.

“…Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied using spectroscopic ellipsometry. The rigorous coupled-wave…”
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Spectroscopic ellipsometry on sinusoidal surface-relief gratings by Antos, R., Ohlidal, I., Franta, D., Klapetek, P., Mistrik, J., Yamaguchi, T., Visnovsky, S.

“…Spectroscopic ellipsometry (SE) is used to study a sinusoidal-relief grating fabricated on a surface of transparent polymer. An optically thick polymer layer…”
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Spectroscopic ellipsometry of TaNx and VN films by Mistrik, J., Takahashi, K., Antos, R., Aoyama, M., Yamaguchi, T., Anma, Y., Fukuda, Y., Takeyama, M.B., Noya, A., Jiang, Z.-T., Thurgate, S.M., Riessen, G.V.

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Corrigendum to “Pure TeO2 glass: Influence of synthesis conditions on linear and non-linear optical, magneto-optical and structural properties,” [J. Alloys Compd., 997 (2024) 174788] by Hrabovsky, J., Tagiara, N.S., Mistrik, J., Strizik, L., Rysanek, P., Kopecky, V., Kozlik, J., Orava, J., Wang, S., Ishibashi, T., Kamitsos, E.I., Veis, M.

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Pure TeO2 glass: Influence of synthesis conditions on linear and non-linear optical, magneto-optical and structural properties by Hrabovsky, J., Tagiara, N.S., Mistrik, J., Strizik, L., Rysanek, P., Kopecky Jr, V., Kozlik, J., Orava, J., Wang, S., Ishibashi, T., Kamitsos, E.I., Veis, M.

“…The first systematic study of linear and non-linear optical, magneto-optical and structural properties of pure TeO2 glass is presented with regard to different…”
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Spectroscopic ellipsometry of pulsed laser irradiated c-Ge surfaces by Mistrik, J., Antos, R., Murakami, K., Aoyama, M., Yamaguchi, T., Anma, Y., Fukuda, Y., Medvid’, A., Michko, A.

“…Spectro-ellipsometric measurements were carried out on pulsed laser irradiated c-Ge surfaces. Numerical analyses indicated two possible parameterizations of…”
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