Search Results - "Minamisawa, R.A."
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Top-down fabricated silicon nanowires under tensile elastic strain up to 4.5
Published in Nature communications (02-10-2012)“…Strained Si nanowires are among the most promising transistor structures for implementation in very large-scale integration due to of their superior…”
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Thermoelectric properties of Zn4Sb3/CeFe(4−)Co Sb12 nano-layered superlattices modified by MeV Si ion beam
Published in Applied surface science (01-08-2014)Get full text
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Device Simulations on Novel High Channel Mobility 4H-SiC Trench MOSFETs and Their Fabrication Processes
Published in Microelectronic engineering (01-09-2015)“…The aim of this study is to combine the UMOSFET design with its U-shape trench-gate architecture which is well-established in silicon technology and benefits…”
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MeV Si ions bombardment effects on the thermoelectric properties of nano-layers of nanoclusters of Ag in SiO 2 host
Published in Surface & coatings technology (2009)“…We prepared 50 periodic nano-layers of SiO 2/Ag x SiO 2(1 − x) with Au layer deposited on both sides as metal contacts. The deposited multi-layer films have a…”
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MeV Si ions bombardment effects on the thermoelectric properties of nano-layers of nanoclusters of Ag in SiO2 host
Published in Surface & coatings technology (15-06-2009)Get full text
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Impact of strain and Ge concentration on the performance of planar SiGe band-to-band-tunneling transistors
Published in Solid-state electronics (01-05-2012)“…► n- and p-type compressively strained Si1-xGex TFETs were fabricated. ► Si0.5Ge0.5 TFETs show best performance with high on-current and low subthreshold…”
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High mobility strained Si0.5Ge0.5/SSOI short channel field effect transistors with TiN/GdScO3 gate stack
Published in Microelectronic engineering (01-09-2011)Get full text
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High mobility strained Si 0.5Ge 0.5/SSOI short channel field effect transistors with TiN/GdScO 3 gate stack
Published in Microelectronic engineering (2011)“…Short channel p-type metal-oxide-semiconductor field effect transistors (MOSFETs) with GdScO 3 gate dielectric were fabricated on a quantum well strained…”
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Surface modification of Si/Ge multi-layers by MeV Si ion bombardment
Published in Surface & coatings technology (15-06-2009)“…We made 50 periodic nano-layers of Si/Ge superlattice films with Au layers deposited on both sides as metal contacts. Each layer is 7.3 nm thick. The…”
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Effects of low and high energy ion bombardment on ETFE polymer
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01-04-2007)“…The polymer ethylenetetrafluoroethylene (ETFE) is used as anti-adherent coatings for food packages and radiation dosimeters. In this work, we compare the…”
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Investigations of low-energy ion irradiation influence on glassy polymeric carbon
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01-04-2007)“…Glassy polymeric carbon (GPC), which is made from phenolic resins, has a high chemical inertness and is used as high temperature and radiation resistant…”
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Study of Arsenic ion implantation of patterned strained Si NWs
Published in Solid-state electronics (01-06-2011)“…► The formation of highly doped strained Si NWs and layers on insulator is presented. ► Patterning of doped layers results in perfect crystalline doped…”
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Damage effects of gamma and X-rays in polymer film electrets
Published in Surface & coatings technology (05-08-2007)“…Dosimeters produced with electret materials are able to detect X-rays, α, β, γ rays, electrons and other charged particles and, with appropriate converters,…”
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Journal Article Conference Proceeding -
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Electret Pattern Fornation in Teflon by Pyroeletric and Photogalvanic Electron Emission From LiNbO3
Published in 2005 12th International Symposium on Electrets (2005)“…High field emission of electrons in the c direction of pyroelectric LiNbO 3 has recently been reported [Ref.1]. With modest temperature variations, electron…”
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Conference Proceeding -
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Advances in Si & Ge millisecond processing: From silicon-on-insulator to superconducting Ge
Published in 2009 17th International Conference on Advanced Thermal Processing of Semiconductors (01-09-2009)“…Advanced SOI material can be treated in advantageous manner regarding ultra shallow junction (USJ) formation using millisecond annealing techniques…”
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Conference Proceeding