Search Results - "Minamisawa, R.A."

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  1. 1

    Top-down fabricated silicon nanowires under tensile elastic strain up to 4.5 by Minamisawa, R.A., Süess, M.J., Spolenak, R., Faist, J., David, C., Gobrecht, J., Bourdelle, K.K., Sigg, H.

    Published in Nature communications (02-10-2012)
    “…Strained Si nanowires are among the most promising transistor structures for implementation in very large-scale integration due to of their superior…”
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    Journal Article
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    Device Simulations on Novel High Channel Mobility 4H-SiC Trench MOSFETs and Their Fabrication Processes by Rossmann, H.R., Bubendorf, A., Zanella, F., Marjanović, N., Schnieper, M., Meyer, E., Jung, T.A., Gobrecht, J., Minamisawa, R.A., Bartolf, H.

    Published in Microelectronic engineering (01-09-2015)
    “…The aim of this study is to combine the UMOSFET design with its U-shape trench-gate architecture which is well-established in silicon technology and benefits…”
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    Journal Article
  4. 4

    MeV Si ions bombardment effects on the thermoelectric properties of nano-layers of nanoclusters of Ag in SiO 2 host by Budak, S., Guner, S., Minamisawa, R.A., ILA, D.

    Published in Surface & coatings technology (2009)
    “…We prepared 50 periodic nano-layers of SiO 2/Ag x SiO 2(1 − x) with Au layer deposited on both sides as metal contacts. The deposited multi-layer films have a…”
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    Journal Article
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    Impact of strain and Ge concentration on the performance of planar SiGe band-to-band-tunneling transistors by Schmidt, M., Minamisawa, R.A., Richter, S., Luptak, R., Hartmann, J.-M., Buca, D., Zhao, Q.T., Mantl, S.

    Published in Solid-state electronics (01-05-2012)
    “…► n- and p-type compressively strained Si1-xGex TFETs were fabricated. ► Si0.5Ge0.5 TFETs show best performance with high on-current and low subthreshold…”
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    Journal Article Conference Proceeding
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    High mobility strained Si 0.5Ge 0.5/SSOI short channel field effect transistors with TiN/GdScO 3 gate stack by Minamisawa, R.A., Schmidt, M., Durgun Özben, E., Lopes, J.M.J., Hartmann, J.M., Bourdelle, K.K., Schubert, J., Zhao, Q.T., Buca, D., Mantl, S.

    Published in Microelectronic engineering (2011)
    “…Short channel p-type metal-oxide-semiconductor field effect transistors (MOSFETs) with GdScO 3 gate dielectric were fabricated on a quantum well strained…”
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    Journal Article
  10. 10

    Surface modification of Si/Ge multi-layers by MeV Si ion bombardment by Budak, S., Guner, S., Smith, C., Minamisawa, R.A., Zheng, B., Muntele, C., Ila, D.

    Published in Surface & coatings technology (15-06-2009)
    “…We made 50 periodic nano-layers of Si/Ge superlattice films with Au layers deposited on both sides as metal contacts. Each layer is 7.3 nm thick. The…”
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    Journal Article Conference Proceeding
  11. 11

    Effects of low and high energy ion bombardment on ETFE polymer by Minamisawa, R.A., De Almeida, A., Abidzina, V., Parada, M.A., Muntele, I., Ila, D.

    “…The polymer ethylenetetrafluoroethylene (ETFE) is used as anti-adherent coatings for food packages and radiation dosimeters. In this work, we compare the…”
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    Journal Article
  12. 12

    Investigations of low-energy ion irradiation influence on glassy polymeric carbon by Abidzina, V., Tereshko, I., Elkin, I., Muntele, I., Muntele, C., Minamisawa, R.A., Ila, D.

    “…Glassy polymeric carbon (GPC), which is made from phenolic resins, has a high chemical inertness and is used as high temperature and radiation resistant…”
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    Journal Article
  13. 13

    Study of Arsenic ion implantation of patterned strained Si NWs by Minamisawa, R.A., Habicht, S., Knoll, L., Zhao, Q.T., Buca, D., Mantl, S., Köhler, F., Carius, R.

    Published in Solid-state electronics (01-06-2011)
    “…► The formation of highly doped strained Si NWs and layers on insulator is presented. ► Patterning of doped layers results in perfect crystalline doped…”
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    Journal Article Conference Proceeding
  14. 14

    Damage effects of gamma and X-rays in polymer film electrets by Parada, M.A., Minamisawa, R.A., Moreira, M.V., de Almeida, A., Muntele, I., Ila, D.

    Published in Surface & coatings technology (05-08-2007)
    “…Dosimeters produced with electret materials are able to detect X-rays, α, β, γ rays, electrons and other charged particles and, with appropriate converters,…”
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    Journal Article Conference Proceeding
  15. 15

    Electret Pattern Fornation in Teflon by Pyroeletric and Photogalvanic Electron Emission From LiNbO3 by Minamisawa, R.A., Parada, M.A., de Almeida, A., Kukhtarev, N., Kukhtareva, T., Zimmerman, R.L.

    “…High field emission of electrons in the c direction of pyroelectric LiNbO 3 has recently been reported [Ref.1]. With modest temperature variations, electron…”
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    Conference Proceeding
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    Advances in Si & Ge millisecond processing: From silicon-on-insulator to superconducting Ge by Skorupa, W., Heera, V., Herrmannsdorfer, T., Posselt, M., Buca, D., Minamisawa, R.A., Mantl, S., Anwand, W., Gebel, T.

    “…Advanced SOI material can be treated in advantageous manner regarding ultra shallow junction (USJ) formation using millisecond annealing techniques…”
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    Conference Proceeding