The role of terminal oxide structure and properties in nanothermite reactions

In this report, thin films of copper oxide, a common thermite oxidant, and varying metallic species (Al, Zr, and Mg) were deposited in an alternating layered geometry on sapphire by magnetron sputtering. Keeping stoichiometric equivalence, the effects of varying metallic constituents were studied wi...

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Bibliographic Details
Published in:	Thin solid films Vol. 562; pp. 405 - 410
Main Authors:	Mily, E.J., Oni, A., LeBeau, J.M., Liu, Y., Brown-Shaklee, H.J., Ihlefeld, J.F., Maria, J.-P.
Format:	Journal Article
Language:	English
Published:	Amsterdam Elsevier B.V 01-07-2014 Elsevier
Subjects:	Aluminum Annealing ANNEALING PROCESSES Barrier layer Condensed matter: structure, mechanical and thermal properties COPPER OXIDE Cross-disciplinary physics: materials science; rheology Deposition by sputtering DIFFERENTIAL THERMAL ANALYSIS Diffusion; interface formation Energetic material Exact sciences and technology Magnetron sputtering Materials science Methods of deposition of films and coatings; film growth and epitaxy MICROSTRUCTURES Nanostructure Oxidants OXIDES Physics Solid surfaces and solid-solid interfaces SPUTTERING Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) Terminals THIN FILMS VACUUM ANNEALING Barrier layer Film Energetic material Thin films Temperature dependence Cathode sputtering Physical vapor deposition Differential thermal analysis XRD Diffusion Sputter deposition Copper oxide
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Summary:	In this report, thin films of copper oxide, a common thermite oxidant, and varying metallic species (Al, Zr, and Mg) were deposited in an alternating layered geometry on sapphire by magnetron sputtering. Keeping stoichiometric equivalence, the effects of varying metallic constituents were studied with respect to their onset reaction temperature and energy output. Reaction progression was characterized by a systematic step wise vacuum anneal followed by subsequent ex situ X-ray diffraction, and differential thermal analysis. It was found that reaction temperature depends heavily on the terminal oxide's diffusion properties, showing a correlation •Thin film thermite laminate structures were fabricated via magnetron sputtering.•Oxygen source and interfacial area are held constant while reducing metal varied.•Thermite terminal oxide ionic diffusion barrier properties affect energy release.
Bibliography:	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23
ISSN:	0040-6090 1879-2731
DOI:	10.1016/j.tsf.2014.05.005