Search Results - "Midgley, P"

3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography by Midgley, P.A., Weyland, M.

“…The rapid advances in nanotechnology and the ever decreasing size of features in the microelectronics industry brings with it the need for advanced…”
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Structure−Activity Relationship in Nanostructured Copper−Ceria-Based Preferential CO Oxidation Catalysts by Gamarra, D, Munuera, G, Hungría, A. B, Fernández-García, M, Conesa, J. C, Midgley, P. A, Wang, X. Q, Hanson, J. C, Rodríguez, J. A, Martínez-Arias, A

“…Two series of nanostructured oxidized copper−cerium catalysts with varying copper loadings, and prepared, respectively, by impregnation of ceria and by…”
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Coarsening behaviour and interfacial structure of γ′ precipitates in Co-Al-W based superalloys by Vorontsov, V.A., Barnard, J.S., Rahman, K.M., Yan, H.-Y., Midgley, P.A., Dye, D.

“…This work discusses the effects of alloying on the coarsening behaviour of the L12 ordered γ′ phase and the structure of the γ/γ′ interfaces in three Co-Al-W…”
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Embedded Nanostructures Revealed in Three Dimensions by Arslan, I, Yates, T. J. V, Browning, N. D, Midgley, P. A

“…Nanotechnology creates a new challenge for materials characterization because device properties now depend on size and shape as much as they depend on the…”
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Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys by Thronsen, E., Bergh, T., Thorsen, T.I., Christiansen, E.F., Frafjord, J., Crout, P., van Helvoort, A.T.J., Midgley, P.A., Holmestad, R.

“…Mapping the spatial distribution of crystal phases with nm-scale spatial resolution is an important characterisation task in studies of multi-phase materials…”
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Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars by Korte, S., Ritter, M., Jiao, C., Midgley, P.A., Clegg, W.J.

“…Small-scale testing is extensively used to study the effects of size on plasticity or characterise plastic deformation of brittle materials, where cracking is…”
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Entropic Comparison of Atomic-Resolution Electron Tomography of Crystals and Amorphous Materials by Collins, S M, Leary, R K, Midgley, P A, Tovey, R, Benning, M, Schönlieb, C-B, Rez, P, Treacy, M M J

“…Electron tomography bears promise for widespread determination of the three-dimensional arrangement of atoms in solids. However, it remains unclear whether…”
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High-Resolution Three-Dimensional Imaging of Dislocations by Barnard, J.S, Sharp, J, Tong, J.R, Midgley, P.A

“…Dislocations and their interactions govern the properties of many materials, ranging from work hardening in metals to device pathology in semiconductor laser…”
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Nanocrystal segmentation in scanning precession electron diffraction data by BERGH, T., JOHNSTONE, D.N., CROUT, P., HØGÅS, S., MIDGLEY, P.A., HOLMESTAD, R., VULLUM, P.E., HELVOORT, A.T.J. VAN

“…Summary Scanning precession electron diffraction (SPED) enables the local crystallography of materials to be probed on the nanoscale by recording a…”
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Validation of the continuous glucose monitoring sensor in preterm infants by Beardsall, K, Vanhaesebrouck, S, Ogilvy-Stuart, A L, Vanhole, C, VanWeissenbruch, M, Midgley, P, Thio, M, Cornette, L, Ossuetta, I, Palmer, C R, Iglesias, I, de Jong, M, Gill, B, de Zegher, F, Dunger, D B

“…Recent studies have highlighted the need for improved methods of monitoring glucose control in intensive care to reduce hyperglycaemia, without increasing the…”
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A history of chemically and radiatively important gases in air deduced from ALE/GAGE/AGAGE by Prinn, R. G., Weiss, R. F., Fraser, P. J., Simmonds, P. G., Cunnold, D. M., Alyea, F. N., O'Doherty, S., Salameh, P., Miller, B. R., Huang, J., Wang, R. H. J., Hartley, D. E., Harth, C., Steele, L. P., Sturrock, G., Midgley, P. M., McCulloch, A.

“…We describe in detail the instrumentation and calibrations used in the Atmospheric Lifetime Experiment (ALE), the Global Atmospheric Gases Experiment (GAGE),…”
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A novel 3D absorption correction method for quantitative EDX-STEM tomography by Burdet, Pierre, Saghi, Z., Filippin, A.N., Borrás, A., Midgley, P.A.

“…This paper presents a novel 3D method to correct for absorption in energy dispersive X-ray (EDX) microanalysis of heterogeneous samples of unknown structure…”
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Weak charge-lattice coupling requires reinterpretation of stripes of charge order in La1-xCaxMnO3 by LOUDON, J. C, COX, S, WILLIAMS, A. J, ATTFIELD, J. P, LITTLEWOOD, P. B, MIDGLEY, P. A, MATHUR, N. D

“…Modulations in manganites attributed to stripes of charge/orbital/spin order are thought to result from strong electron-lattice interactions that lock the…”
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On the precipitation of delta phase in ALLVAC® 718Plus by Messé, O.M., Barnard, J.S., Pickering, E.J., Midgley, P.A., Rae, C.M.F.

“…ALLVAC 718Plus is a new commercial superalloy derived from Inconel 718, but possessing a higher temperature capability whilst employing the same philosophy…”
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Enhanced quantification for 3D SEM–EDS: Using the full set of available X-ray lines by Burdet, Pierre, Croxall, S.A., Midgley, P.A.

“…An enhanced method to quantify energy dispersive spectra recorded in 3D with a scanning electron microscope (3D SEM–EDS) has been previously demonstrated. This…”
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Extended ptychography in the transmission electron microscope: Possibilities and limitations by Hüe, F., Rodenburg, J.M., Maiden, A.M., Midgley, P.A.

“…The extended-ptychographical iterative engine (e-PIE) is a recently developed powerful phase retrieval algorithm which can be used to measure the phase…”
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Is precession electron diffraction kinematical? Part I: "Phase-scrambling" multislice simulations by White, T A, Eggeman, A S, Midgley, P A

“…Results from multislice simulations are presented which demonstrate that diffracted intensities obtained using precession electron diffraction are less…”
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Ultrafast electron diffraction pattern simulations using GPU technology. Applications to lattice vibrations by Eggeman, A.S., London, A., Midgley, P.A.

“…Graphical processing units (GPUs) offer a cost-effective and powerful means to enhance the processing power of computers. Here we show how GPUs can greatly…”
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Quantitative electron holography of biased semiconductor devices by Twitchett, A C, Dunin-Borkowski, R E, Midgley, P A

“…Electron holography is used to measure electrostatic potential profiles across reverse-biased Si p-n junctions in situ in the transmission electron microscope…”
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On the nature of the omega tri-layer periodicity in rapidly cooled Ti-15Mo by Bennett, J.M., Barnard, J.S., Stone, H.J., Midgley, P.A., Rugg, D., Jones, N.G.

“…[Display omitted] High angle annular dark field (HAADF) images of the omega phase in metastable beta titanium alloys exhibit tri-layered periodicity. However,…”
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