Search Results - "Microelectronics and reliability"

Reliability challenges in 3D IC packaging technology by Tu, K.N.

“…At the moment, a major paradigm change, from 2D IC to 3D IC, is occurring in microelectronic industry. Joule heating is serious in 3D IC, and vertical…”
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Lock-V: A heterogeneous fault tolerance architecture based on Arm and RISC-V by Marques, Ivo, Rodrigues, Cristiano, Tavares, Adriano, Pinto, Sandro, Gomes, Tiago

“…This article presents Lock-V, a heterogeneous fault tolerance architecture that explores a dual-core lockstep (DCLS) technique to mitigate single event upset…”
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Experimental investigation of PCB embedded 1200 V IGBT/diode power pre-package under high-humidity high-temperature reverse voltage bias by Huesgen, T., Sharma, A.B., Rawal, K.B., Polezhaev, V., Stohrer, G., Koch, F., Vaas, M.

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An improved unscented particle filter approach for lithium-ion battery remaining useful life prediction by Zhang, Heng, Miao, Qiang, Zhang, Xin, Liu, Zhiwen

“…Lithium-ion rechargeable batteries are widely used as power sources for mobile phones, laptops and electric cars, and gradually extended to military…”
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Deep neural networks-based rolling bearing fault diagnosis by Chen, Zhiqiang, Deng, Shengcai, Chen, Xudong, Li, Chuan, Sanchez, René-Vinicio, Qin, Huafeng

“…Rolling bearing is one of the most commonly used components in rotating machinery. It's so easy to be damaged that it can cause mechanical fault. Thus, it is…”
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Reliability experiments of sintered silver based interconnections by accelerated isothermal bending tests by Heilmann, Jens, Nikitin, Ivan, Zschenderlein, Uwe, May, Daniel, Pressel, Klaus, Wunderle, Bernhard

“…Integration of more functionality and smaller chips into decreasing package volume leads to increasing heat generation. In addition, the use of new compound…”
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Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETs by Aichinger, Thomas, Rescher, Gerald, Pobegen, Gregor

“…Silicon carbide (SiC) based metal-oxide semiconductor-field-effect-transistors (MOSFETs) are increasingly entering the high power device market. Besides all…”
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Comphy — A compact-physics framework for unified modeling of BTI by Rzepa, G., Franco, J., O’Sullivan, B., Subirats, A., Simicic, M., Hellings, G., Weckx, P., Jech, M., Knobloch, T., Waltl, M., Roussel, P.J., Linten, D., Kaczer, B., Grasser, T.

“…Metal-oxide-semiconductor (MOS) devices are affected by generation, transformation, and charging of oxide and interface defects. Despite 50 years of research,…”
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A review: On the development of low melting temperature Pb-free solders by Kotadia, Hiren R., Howes, Philip D., Mannan, Samjid H.

“…Pb-based solders have been the cornerstone technology of electronic interconnections for many decades. However, with legislation in the European Union and…”
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A lifetime assessment and prediction method for large area solder joints by Lederer, M., Kotas, A. Betzwar, Khatibi, G.

“…Mechanical bending fatigue experiments were conducted on large area Pb-rich and SnSb-based model solder joints consisting of Cu-strip/solder/DCB substrates…”
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Lithium-ion batteries remaining useful life prediction based on a mixture of empirical mode decomposition and ARIMA model by Zhou, Yapeng, Huang, Miaohua

“…Prediction of lithium-ion batteries remaining useful life (RUL) plays an important role in battery management system (BMS) used in electric vehicles. A novel…”
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An ensemble model for predicting the remaining useful performance of lithium-ion batteries by Xing, Yinjiao, Ma, Eden W.M., Tsui, Kwok-Leung, Pecht, Michael

“…► The capacity degradation of lithium battery was characterized by an ensemble model. ► The remaining useful performance was presented as probability…”
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Data-driven hybrid remaining useful life estimation approach for spacecraft lithium-ion battery by Song, Yuchen, Liu, Datong, Yang, Chen, Peng, Yu

“…Electrical power system (EPS) is one of the most critical sub-systems of the spacecraft. Lithium-ion battery is the vital component is the EPS. Remaining…”
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Light emitting diodes reliability review by Chang, Moon-Hwan, Das, Diganta, Varde, P.V., Pecht, Michael

“…► This paper provides a comprehensive review of LED failure mechanisms and reliability. ► We discuss the fundamental types of LED failure mechanisms from a…”
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Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip by Du, Xuecheng, Liu, Shuhuan, Luo, Dongyang, Zhang, Yao, Du, Xiaozhi, He, Chaohui, Ren, Xiaotang, Yang, Weitao, Yuan, Yuan

“…In this paper, experimental methods are emphatically described for measuring the proton single event effects (SEE) in Xilinx Zynq-7010 system-on chip…”
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A novel prediction method based on the support vector regression for the remaining useful life of lithium-ion batteries by Zhao, Qi, Qin, Xiaoli, Zhao, Hongbo, Feng, Wenquan

“…Traditional approaches to lithium-ion battery health management mostly focus on the state of charge (SOC) estimation issues, whereas the state of health (SOH)…”
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Prognostics for state of health estimation of lithium-ion batteries based on combination Gaussian process functional regression by Liu, Datong, Pang, Jingyue, Zhou, Jianbao, Peng, Yu, Pecht, Michael

“…State of health (SOH) estimation plays a significant role in battery prognostics. It is used as a qualitative measure of the capability of a lithium-ion…”
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A lithium-ion battery remaining useful life prediction method based on the incremental capacity analysis and Gaussian process regression by Pang, Xiaoqiong, Liu, Xiaoyan, Jia, Jianfang, Wen, Jie, Shi, Yuanhao, Zeng, Jianchao, Zhao, Zhen

“…Remaining useful life (RUL) is a critical metric of lithium-ion battery prognostic and health management. Accurate prediction of RUL is of great significance…”
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Remaining useful life prediction of lithium-ion battery with unscented particle filter technique by Miao, Qiang, Xie, Lei, Cui, Hengjuan, Liang, Wei, Pecht, Michael

“…Accurate prediction of the remaining useful life of a faulty component is important to the prognosis and health management of a system. It gives operators…”
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Thermal performance of heat sink using nano-enhanced phase change material (NePCM) for cooling of electronic components by Kumar, Anuj, Kothari, Rohit, Sahu, Santosh Kumar, Kundalwal, Shailesh Ishwarlal

“…Present experimental study reports the thermal performance of nano-enhanced phase change material (NePCM) based thermal energy storage system for cooling of…”
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