Search Results - "Mickevicius, R"

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  1. 1

    Enhancement-Mode Recessed Gate and Cascode Gate Junctionless Nanowire With Low-Leakage and High-Drive Current by Wong, Hiu Yung, Braga, Nelson, Mickevicius, R. V.

    Published in IEEE transactions on electron devices (01-09-2018)
    “…Junctionless (JL) nanowire is a promising candidate for the future technology nodes because it obviates the need for ultrasteep junction formation. However,…”
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    Journal Article
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    Normally-Off GaN HFET Based on Layout and Stress Engineering by Hiu Yung Wong, Braga, Nelson, Mickevicius, R. V.

    Published in IEEE electron device letters (01-12-2016)
    “…A novel normally-off GaN HFET based on layout and stress engineering is proposed and verified using technology CAD (TCAD) simulations. It requires no process…”
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    Journal Article
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    Solitary solutions to a metastasis model represented by two systems of coupled Riccati equations by Timofejeva, I., Telksnys, T., Navickas, Z., Marcinkevicius, R., Mickevicius, R., Ragulskis, M.

    Published in Journal of King Saud University. Science (01-07-2023)
    “…Solitary solutions to a two-tumor metastasis model represented by a system of multiplicatively coupled Riccati equations are considered in this paper. The…”
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    Journal Article
  4. 4

    Solitary solutions to an androgen‐deprivation prostate cancer treatment model by Telksnys, T., Timofejeva, I., Navickas, Z., Marcinkevicius, R., Mickevicius, R., Ragulskis, M.

    “…A model of androgen deprivation treatment for prostate cancer is considered in this paper. Bright/dark solitary solutions to the model are constructed using…”
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    Journal Article
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    Prediction of highly scaled hydrogen-terminated diamond MISFET performance based on calibrated TCAD simulation by Wong, Hiu Yung, Braga, Nelson, Mickevicius, R.V.

    Published in Diamond and related materials (01-11-2017)
    “…TCAD simulation is calibrated to experimental IDVD, IDVG and fT data from an H-terminated diamond MISFET from the literature. With one set of self-consistent…”
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    Journal Article
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    Simulation of gate lag and current collapse in gallium nitride field-effect transistors by Braga, N., Mickevicius, R., Gaska, R., Shur, M. S., Khan, M. Asif, Simin, G.

    Published in Applied physics letters (15-11-2004)
    “…Results of two-dimensional numerical simulations of gate lag and current collapse in GaN heterostructure field-effect transistors are presented. Simulation…”
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    Journal Article
  8. 8

    Design space and origin of off-state leakage in GaN vertical power diodes by Zhang, Y., Wong, H.-Y, Sun, M., Joglekar, S., Yu, L., Braga, N. A., Mickevicius, R. V., Palacios, T.

    “…Variable-range-hopping through dislocations was identified as the main off-state leakage mechanism for GaN vertical diodes on different substrates. The…”
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    Conference Proceeding Journal Article
  9. 9

    Simulation study of single-event gate rupture using radiation-hardened stripe cell power MOSFET structures by Titus, J.L., Yen-Sheng Su, Savage, M.W., Mickevicius, R.V., Wheatley, C.F.

    Published in IEEE transactions on nuclear science (01-12-2003)
    “…A two-dimension simulation study of single-event gate rupture (SEGR) in radiation-hardened stripe cell power MOSFETs is reported. Simulations are performed on…”
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    Journal Article
  10. 10

    Normally-OFF dual-gate Ga2O3 planar MOSFET and FinFET with high ION and BV by Wong, H. Y., Braga, N., Mickevicius, R. V., Ding, F.

    “…Ga 2 O 3 is a promising Wide-Band-Gap material for power electronics due to its large bandgap and inexpensive native substrate. However, due to technological…”
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    Conference Proceeding
  11. 11

    Study of the effects of barrier and passivation nitride stresses on AlGaN/GaN HEMT performance using TCAD simulation by Hiu Yung Wong, Braga, Nelson, Mickevicius, R. V., Jie Liu

    “…Using TCAD simulation, we studied the stress effect of pseudomorphically grown Al 0.25 Ga 0.75 N barrier and passivation nitride with intrinsic stress on the…”
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    Conference Proceeding
  12. 12

    TCAD calibration of USJ profiles for advanced deep sub-μm CMOS processes by Zechner, C, Matveev, D, Erlebach, A, Simeonov, S, Menialenko, V, Mickevicius, R, Foad, M, Al-Bayati, A, Lebedev, A, Posselt, M

    “…For advanced technologies there is a lack of experimental data and calibrated physical models that enable accurate simulation of CMOS technologies down to…”
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    Journal Article
  13. 13
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    Simulation of gate lag and current collapse in GaN heterojunction field effect transistors by Braga, N., Mickevicius, R., Shur, M., Gaska, R., Asif Khan, M., Simin, G.

    “…We present results from numerical simulations of the current collapse phenomenon in GaN heterostructure field effect transistors. Gate lag simulation results…”
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    Conference Proceeding
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    Monte Carlo simulation of THz frequency power generation in notched n +–n −–n–n + 4H-SiC structures by Zhao, Jian H, Gruzinskis, V, Mickevicius, R, Shiktorov, P, Starikov, E

    “…Steady state transport and microwave power generation is theoretically investigated in 4H-SiC n +–n −–n–n + structures along c-axis by Monte Carlo Particle…”
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    Journal Article Conference Proceeding
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    Negative absolute conductivity in quantum wires by MICKEVICIUS, R, MITIN, V, STROSCIO, M. A, DUTTA, M

    Published in Applied physics letters (19-04-1993)
    “…The effect of negative absolute conductivity in quasi-one-dimensional quantum wire structures is obtained by the Monte Carlo simulation. This negative…”
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    Journal Article
  20. 20

    A physical model of the abnormal behavior of hydrogen-terminated Diamond MESFET by Hiu Yung Wong, Braga, Nelson, Mickevicius, R. V.

    “…Hydrogen-terminated Diamond MESFET exhibits abnormal gate capacitance-voltage (CV) relationship, with an insulator barrier-like plateau followed by an abrupt…”
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    Conference Proceeding