Search Results - "Meyer, William K."

A Non-Aging Screen to Prevent Wearout of Ultra-Thin Dielectrics by Meyer, William K., Crook, Dwight L.

“…As MOS gate dielectrics are scaled to thinner dimensions, lognormal statistics determine the limit at which aging screens are no longer effective in reducing…”
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Model for Oxide Wearout Due to Charge Trapping by Meyer, William K., Crook, Dwight L.

“…Scaling of MOS gate oxides below 200Å can result in wearout of intrinsic oxides. This paper presents studies of thin gate oxides which show that the time…”
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Redundancy Reliability by Crook, Dwight L., Meyer, William K.

“…Programmable redundant row and column elements are presently being used as a yield enhancement tool on the more advanced high density memory devices. This…”
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