Search Results - "Metcalf, T H"

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  1. 1

    Excess specific heat in evaporated amorphous silicon by Queen, D R, Liu, X, Karel, J, Metcalf, T H, Hellman, F

    Published in Physical review letters (28-03-2013)
    “…The specific heat C of e-beam evaporated amorphous silicon (a-Si) thin films prepared at various growth temperatures T(S) and thicknesses t was measured from 2…”
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    Journal Article
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    Hydrogen-Induced Ultralow Optical Absorption and Mechanical Loss in Amorphous Silicon for Gravitational-Wave Detectors by Molina-Ruiz, M, Markosyan, A, Bassiri, R, Fejer, M M, Abernathy, M, Metcalf, T H, Liu, X, Vajente, G, Ananyeva, A, Hellman, F

    Published in Physical review letters (22-12-2023)
    “…The sensitivity of gravitational-wave detectors is limited by the mechanical loss associated with the amorphous coatings of the detectors' mirrors. Amorphous…”
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    Journal Article
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    Dielectric loss extraction for superconducting microwave resonators by McRae, C. R. H., Lake, R. E., Long, J. L., Bal, M., Wu, X., Jugdersuren, B., Metcalf, T. H., Liu, X., Pappas, D. P.

    Published in Applied physics letters (11-05-2020)
    “…The investigation of two-level-state (TLS) loss in dielectric materials and interfaces remains at the forefront of materials research in superconducting…”
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    Journal Article
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    Laser fluence dependence of the elastic properties of diamond-like carbon films prepared by pulsed-laser deposition by Liu, Xiao, Metcalf, T.H., Mosaner, P., Miotello, A.

    Published in Applied surface science (30-05-2007)
    “…We studied the temperature dependence of internal friction of variety of amorphous diamond-like carbon films prepared by pulsed-laser deposition. Like the most…”
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    Journal Article Conference Proceeding
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    Two-level systems in evaporated amorphous silicon by Queen, D.R., Liu, X., Karel, J., Jacks, H.C., Metcalf, T.H., Hellman, F.

    Published in Journal of non-crystalline solids (01-10-2015)
    “…In e-beam evaporated amorphous silicon (a-Si), the densities of two-level systems (TLS), n0 and P¯, determined from specific heat C and internal friction Q−1…”
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    Journal Article
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    Light-induced metastability in pure and hydrogenated amorphous silicon by Queen, D. R., Liu, X., Karel, J., Wang, Q., Crandall, R. S., Metcalf, T. H., Hellman, F.

    Published in Europhysics letters (01-10-2015)
    “…Light soaking is found to increase the specific heat C and internal friction of pure (a-Si) and hydrogenated (a-Si:H) amorphous silicon. At the lowest…”
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    Journal Article
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    Evidence of variable discount rates and non-standard discounting in mortality risk valuation by McDonald, R.L., Chilton, S.M., Jones-Lee, M.W., Metcalf, H.R.T.

    “…Time discounting is central to the valuation of future health and mortality risks in public sector allocative decision-making, particularly for environmental…”
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    Journal Article
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    Amorphous Dielectric Thin Films with Extremely Low Mechanical Loss by Liu, X., Queen, D.R., Metcalf, T.H., Karel, J.E., Hellman, F.

    Published in Archives of metallurgy and materials (01-04-2015)
    “…The ubiquitous low-energy excitations are one of the universal phenomena of amorphous solids. These excitations dominate the acoustic, dielectric, and thermal…”
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    Journal Article
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    Decoupling between propagating acoustic waves and two-level systems in hydrogenated amorphous silicon by Molina-Ruiz, M, Jacks, H. C, Queen, D. R, Metcalf, T. H, Liu, X, Hellman, F

    Published 06-05-2021
    “…Phys. Rev. B 104, 024204 (2021) Specific heat measurements of hydrogenated amorphous silicon prepared by hot-wire chemical vapor deposition show a large…”
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    Journal Article
  13. 13

    Structural tunability and origin of two-level systems in amorphous silicon by Jacks, H. C, Molina-Ruiz, M, Weber, M. H, Maldonis, J. J, Voyles, P. M, Metcalf, T. H, Liu, X, Hellman, F

    Published 21-11-2021
    “…Amorphous silicon films prepared by electron beam evaporation have systematically and substantially greater atomic density for higher thickness, higher growth…”
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    Origin of Mechanical and Dielectric Losses from Two-Level Systems in Amorphous Silicon by Molina-Ruiz, M, Rosen, Y. J, Jacks, H. C, Abernathy, M. R, Metcalf, T. H, Liu, X, Dubois, J. L, Hellman, F

    Published 17-08-2020
    “…Phys. Rev. Materials 5, 035601 (2021) Amorphous silicon contains tunneling two-level systems, which are the dominant energy loss mechanisms for amorphous…”
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    Journal Article
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    Temperature effects on the structure and mechanical properties of vapor deposited a-SiO2 by Jambur, V., Molina-Ruiz, M., Dauer, T., Horton-Bailey, D., Vallery, R., Gidley, D., Metcalf, T.H., Liu, X., Hellman, F., Szlufarska, I.

    Published in Journal of non-crystalline solids (01-07-2022)
    “…•Density of vapor deposited a-SiO2 films increases with increasing growth temperature in spite of increasing porosity and size of nanovoids.•Increased density…”
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    Journal Article
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    Internal friction of solid neon and argon films by Metcalf, Thomas H.

    “…The internal friction of solid neon and argon films, with thicknesses of several hundred nanometers, was measured at temperatures up to 25% of the triple point…”
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    Journal Article Conference Proceeding
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    Dielectric loss extraction for superconducting microwave resonators by McRae, C. R. H, Lake, R. E, Long, J. L, Bal, M, Wu, X, Jugdersuren, B, Metcalf, T. H, Liu, X, Pappas, D. P

    Published 02-05-2020
    “…The investigation of two-level-state (TLS) loss in dielectric materials and interfaces remains at the forefront of materials research in superconducting…”
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    Journal Article
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    Valuing lives equally in a benefit-coast analysis of safety projects: A method to reconcile theory and practice by Baker, R., Chilton, S.M., Jones-Lee, M.W., Metcalf, H.R.T.

    Published in Safety science (01-07-2009)
    “…A value of statistical life (VSL) is used in cost-benefit analysis (CBA) as a monetary measure of the benefits to people from small risk reductions that arise…”
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    Journal Article
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    Two-Level Systems in Evaporated Amorphous Silicon by Queen, D. R, Liu, X, Karel, J, Jacks, H. C, Metcalf, T. H, Hellman, F

    Published 13-06-2015
    “…In $e$-beam evaporated amorphous silicon ($a$-Si), the densities of two-level systems (TLS), $n_{0}$ and $\overline{P}$, determined from specific heat $C$ and…”
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    Journal Article
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