Search Results - "Mergens, Markus"
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ESD protection solutions for high voltage technologies
Published in Microelectronics and reliability (01-05-2006)“…There is a trend to revive mature technologies while including high voltage options. ESD protection in those technologies is challenging due to narrow ESD…”
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Journal Article Conference Proceeding -
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Automotive High-Speed Interfaces: Future Challenges for System-level HV-ESD Protection and First- Time-Right Design
Published in 2021 43rd Annual EOS/ESD Symposium (EOS/ESD) (26-09-2021)“…This paper describes future design challenges of discrete system-level ESD protection (high-voltage, low-capacitance) of automotive high-speed data links such…”
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Conference Proceeding -
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Analysis of ESD Behavior of Stacked nMOSFET RF Switches in Bulk Technology
Published in IEEE transactions on electron devices (01-03-2018)“…The operation of stacked MOSFET circuit for RF switch application under electrostatic discharge (ESD) conditions is studied by transmission line pulse (TLP)…”
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High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation
Published in Microelectronics and reliability (01-07-2003)“…This paper presents a novel Silicon Controlled Rectifier (SCR) for power line and local I/O ESD protection. The High holding current SCRs (HHI-SCR) exhibits a…”
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Journal Article -
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ESD-level circuit simulation impact of interconnect RC-delay on HBM and CDM behavior
Published in Journal of electrostatics (2002)“…An extraction method for the distributed, parasitic RC-elements of MOS single- and multi-fingers is introduced by deducing a rule of thumb for an effective…”
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On-Chip ESD
Published in Microelectronics and reliability (01-06-2002)Get full text
Journal Article -
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Analysis of lateral DMOS power devices under ESD stress conditions
Published in IEEE transactions on electron devices (01-11-2000)“…The physical mechanisms specific for 40 V LDMOS power transistors under ESD stress (gate grounded/coupled) are investigated in detail by transmission line…”
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PII: S0026-2714(01)00029-4
Published in Microelectronics and reliability (2001)Get full text
Journal Article -
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ESD protection considerations in high voltage technologies
Published in 2006 Electrical Overstress/Electrostatic Discharge Symposium (01-09-2006)Get full text
Conference Proceeding -
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Advanced SCR ESD protection circuits for CMOS/SOI nanotechnologies
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)“…This paper reviews the application of SCR-based ESD protection circuits in advanced CMOS/SOI technologies. The devices are integrated in a flexible modular…”
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Conference Proceeding -
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Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate-coupling behaviour
Published in Microelectronics and reliability (2000)“…A novel modular strategy for highly flexible modeling of ESD-capable MOS compact models is introduced. This high current MOS model comprises the important…”
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Journal Article -
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Novel design of driver and ESD transistors with significantly reduced silicon area
Published in Microelectronics and reliability (2002)“…This paper presents three novel design techniques, which combined fulfill all major requirements posed on large driver and electrostatic discharge (ESD)…”
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Journal Article -
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ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies
Published in 2005 IEEE International Symposium on Circuits and Systems (ISCAS) (2005)“…This paper presents a protection strategy for ultra-sensitive I/O containing thin gate oxides, while combining two complementary ESD design approaches: (1)…”
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Conference Proceeding -
14
Characterization and optimization of a bipolar ESD-device by measurements and simulations
Published in Microelectronics and reliability (01-11-1999)“…The design of ESD (electro-static discharge) protection structures can be significantly shortened by using thermo-electrical device simulations. In many cases…”
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Journal Article -
15
ESD protection considerations in advanced high-voltage technologies for automotive
Published in 2006 Electrical Overstress/Electrostatic Discharge Symposium (01-09-2006)“…This paper discusses challenges and solutions of automotive ESD protection design in a reliability driven industry. Various ESD/EMI specifications are…”
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Conference Proceeding -
16
ESD protection solutions for high voltage technologies
Published in 2004 Electrical Overstress/Electrostatic Discharge Symposium (01-09-2004)“…There is a trend to revive mature technologies while including high voltage options. ESD protection in those technologies is challenging due to narrow ESD…”
Get full text
Conference Proceeding -
17
High Holding Current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation
Published in 2002 Electrical Overstress/Electrostatic Discharge Symposium (01-10-2002)“…This paper presents a novel SCR for power line and local I/O ESD protection. The HHI-SCR exhibits a dual ESD clamp characteristic: low-current high-voltage…”
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Conference Proceeding -
18
Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate coupling behavior
Published in 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) (1999)“…A novel modular strategy for highly flexible modeling of ESD-capable MOS compact models is introduced. These high current MOS models comprise the important…”
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Conference Proceeding -
19
Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies
Published in Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571) (2004)“…This paper presents a novel active-source-pump (ASP) circuit technique to significantly lower the ESD sensitivity of ultrathin gate inputs in advanced sub-90nm…”
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Conference Proceeding