Search Results - "Mehta, Usha Sandeep"

Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead by Mehta, Usha Sandeep, Dasgupta, Kankar S., Devashrayee, Nirnjan M.

“…A compression-decompression scheme, Modified Selective Huffman (MS-Huffman) scheme based on Huffman code is proposed in this paper. This scheme aims at…”
Get full text

Improvement in error resilience for compressed VLSI test data using Hamming code based technique by Mehta, Usha Sandeep, Parmar, Harikrishna

“…In the current scenario of IP core based SoC, to reduce the test time and test cost, the test data is preprocessed and compressed heavily. This compressed test…”
Get full text

Artificial intelligence based scan vector reordering for capture power minimization by Mehta, U. S., Dasgupta, K. S., Devashrayee, N. M., Parmar, H.

“…Test Power is the major issues for the external testing of IP core based SoC. From a large pool of diverse available techniques for switching activity…”
Get full text

Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead by Mehta, U S, Dasgupta, K S, Devashrayee, N M

“…For SoCs (Sea of Cores!) which contains a large amount of IP cores with pre computed test data, the code based test data compression scheme is more suitable as…”
Get full text

Hamming distance based distributed scan chain reordering for test power optimization by Mehta, U S, Dasgupta, K S, Devashrayee, N M, Choksi, K

“…Scan chain design is a popular design-for-test technique for testing of sequential circuits. Significant amount of power is consumed during loading and…”
Get full text