Ultrathin Films of Silver by Magnetron Sputtering

Ultrathin Films of Silver by Magnetron Sputtering

The interest in ultrathin silver (Ag) films has increased due to their high surface plasmon resonance for coatings of only a few nm. Low roughness ultrathin films of 1 to 9 nm have been deposited on different substrates, such as polyethylene terephthalate (PET) and optical glass, using radio frequen...

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Bibliographic Details
Published in:Inorganics Vol. 10; no. 12; p. 235
Main Authors: Filip, Ana Violeta, Sava, Bogdan Alexandru, Medianu, Rares Victor, Boroica, Lucica, Dinca, Marius Catalin, Pascu, Rovena, Tigau, Nicolae, Andrei, Andreea, Moldovan, Antoniu, Dumitru, Marius, Oane, Mihai, Eftimie, Mihai
Format: Journal Article
Language:English
Published: Basel MDPI AG 01-12-2022
Subjects:
Analysis
Atomic force microscopy
Biopolymers
Dielectric films
Ellipsometry
Film thickness
Glass substrates
Magnetron sputtering
Magnetrons
Microscopy
Morphology
Nanoparticles
Optical glass
Plasma
plasmonic surface resonance
Polyethylene terephthalate
Properties
Radio frequency
refractive index
Refractivity
Roughness
Scanning electron microscopy
Silver
Software
Spectrum analysis
Sputtering (Physics)
Structure
Substrates
Surface plasmon resonance
Thin films
ultrathin films
Ultraviolet spectra
UV-Vis
Working conditions
Romania
United States > US
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Description
Summary:The interest in ultrathin silver (Ag) films has increased due to their high surface plasmon resonance for coatings of only a few nm. Low roughness ultrathin films of 1 to 9 nm have been deposited on different substrates, such as polyethylene terephthalate (PET) and optical glass, using radio frequency (RF) magnetron sputtering. Films show good surface plasmon resonance up to 7 nm thickness, as revealed by the ultraviolet-visible (UV-Vis) spectra. The roughness of the films, investigated by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), is small, and one can conclude that depositions are smooth and homogeneous. The bandgap values decrease with film thickness. The refractive index of the films, calculated from ellipsometry measurements, leads to values of under 1 visible domain, with minima in the wavelength range of 400–600 nm. The results are useful for obtaining lower roughness ultrathin Ag films with good surface plasmon resonance for photonic applications.
ISSN:2304-6740
2304-6740
DOI:10.3390/inorganics10120235