Search Results - "McWaid, T. H."

Design of an atomic force microscope with interferometric position control by Schneir, J., McWaid, T. H., Alexander, J., Wilfley, B. P.

“…Advances in the manufacture of integrated circuits, x‐ray optics, magnetic read–write heads, optical data storage media, and razor blades require advances in…”
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Increasing the value of atomic force microscopy process metrology using a high‐accuracy scanner, tip characterization, and morphological image analysis by Schneir, J., Villarrubia, J. S., McWaid, T. H., Tsai, V. W., Dixson, R.

“…Atomic force microscopes are being used increasingly for process metrology. As a case study, the measurement by atomic force microscope of a soda lime glass…”
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