Search Results - "McClure, Steven S."

Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission by Zajac, Stephanie A., Bozovich, Amanda N., Rax, Bernard G., Davila, Joe, Nguyen, Duc, Parker, Wilson P., Kenna, Aaron J., McClure, Steven S., Thomas, Jason L., Stanford, Kelly W., Sundgaard, Mitch J.

“…We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion…”
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ELDRS Characterization for a Very High Dose Mission by Harris, Richard D, McClure, Steven S, Rax, Bernard G, Thornbourn, Dennis O, Kenna, Aaron J, Clark, Karla B, Tsun-Yee Yan

“…Evaluation of bipolar linear parts which may have Enhanced Low Dose Rate Sensitivity (ELDRS) is problematic for missions that have very high dose radiation…”
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Implanted medical devices in the radiation environment of commercial spaceflight by Reyes, David P, McClure, Steven S, Chancellor, Jeffery C, Blue, Rebecca S, Castleberry, Tarah L, Vanderploeg, James M

“…Some commercial spaceflight participants (SFPs) may have medical conditions that require implanted medical devices (IMDs), such as cardiac pacemakers,…”
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Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode by Tsiligiannis, G., Dilillo, L., Bosio, A., Girard, P., Todri, A., Virazel, A., McClure, S. S., Touboul, A. D., Wrobel, F., Saigne, F.

“…Academic and industrial research interest in terrestrial radiation effects of electronic devices has expanded over the last years from avionics and military…”
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Total Ionizing Dose Measurements of a Commercial Samsung NAND Flash Memory for a High Dose Mission by Allen, Gregory R., Irom, Farokh, Edmonds, Larry, Nguyen, Duc, Scheick, Leif Z., Vartanian, Sergeh, McClure, Steven S., Stanford, Kelly

“…We present total ionizing dose (TID) measurements of a commercial Samsung NAND flash memory intended for use on a high dose mission. Statistical variation in…”
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Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission by Bozovich, Amanda N., Rax, Bernard G., Davila, Joe, Nguyen, Duc, Kenna, Aaron J., Zajac, Stephanie A., McClure, Steven S., Thomas, Jason L., Scheick, Leif Z., Stanford, Kelly W., Gevargiz, Patrick, Sundgaard, Mitch J.

“…This paper reports recent total ionizing dose (TID) test results post 300 kRad(Si) for a variety of common part types evaluated for use on NASA/JPL's Europa…”
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Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits by Adell, P.C., Pease, R.L., Barnaby, H.J., Rax, B., Chen, X.J., McClure, S.S.

“…High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated…”
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Total Dose and Dose Rate Response of an AD590 Temperature Transducer by Pease, R.L., Dunham, G.W., Seiler, J.E., Platteter, D.G., McClure, S.S.

“…The total dose response of the Analog Devices AD590 is presented for a variety of irradiation test conditions. The parts packaged in flat-packs show very large…”
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Radiation effects in micro-electromechanical systems (MEMS): RF relays by McClure, S.S., Edmonds, L.D., Mihailovich, R., Johnston, A.H., Alonzo, P., DeNatale, J., Lehman, J., Yui, C.

“…GaAs micro-electromechanical RF relays fabricated by surface micromachining techniques were characterized for their response to total ionizing dose…”
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Comparison of TID Effects in Space-Like Variable Dose Rates and Constant Dose Rates by Harris, R.D., McClure, S.S., Rax, B.G., Evans, R.W., Jun, I.

“…The degradation of the LM193 dual voltage comparator has been studied at different TID dose rate profiles, including several different constant dose rates and…”
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Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions by McClure, S. S., Harris, R. D., Rax, B. G., Thorbourn, D. O.

“…Radiation hardened linear devices were characterized for performance in combined total dose and displacement damage environments for a mission scenario with a…”
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Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2003 through 2009 by Kenna, A.J., Rax, B.G., Thorbourn, D.O., Harris, R.D., McClure, S.S.

“…Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) tests are being performed at the Jet Propulsion Laboratory on a continual basis to…”
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Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory by McClure, S S, Allen, G R, Irom, F, Scheick, L Z, Adell, P C, Miyahira, T F

“…This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium…”
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