Search Results - "Mayur, Abhilash J."

Low-Resistance Titanium Contacts and Thermally Unstable Nickel Germanide Contacts on p-Type Germanium by Hao Yu, Schaekers, Marc, Schram, Tom, Aderhold, Wolfgang, Mayur, Abhilash J., Mitard, Jerome, Witters, Liesbeth, Barla, Kathy, Collaert, Nadine, Horiguchi, Naoto, Voon-Yew Thean, Aaron, De Meyer, Kristin

“…Ti/p-Ge and NiGe/p-Ge contacts are compared on both planar and fin-based devices. Ti/p-Ge contacts show low contact resistance, while NiGe/p-Ge devices show…”
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Electronic and vibrational spectroscopy of impurities in elemental and compound semiconductors by Mayur, Abhilash J

“…Fourier transform infrared spectroscopy, employed to investigate the electronic and vibrational excitations of impurities present in dilute concentrations in…”
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Characterization of Nickel Silicides Produced by Millisecond Anneals by Adams, B., Jennings, D., Kai Ma, Mayur, A.J., Moffatt, S., Nagy, S.G., Parihar, V.

“…Nickel silicides serve as the source, drain, and gate contact material in many advanced complementary metal oxide semiconductor (CMOS) logic applications…”
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