Search Results - "Matus, Lawrence G."

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  1. 1

    Instrumentation for Aerospace Applications: Electronic-Based Technologies by Matus, Lawrence G

    Published in Journal of aerospace engineering (01-04-2013)
    “…AbstractThroughout the 70-year history of the National Aeronautics and Space Administration (NASA) Glenn Research Center (GRC), instrumentation engineers have…”
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    Journal Article
  2. 2

    Site-competition epitaxy for superior silicon carbide electronics by Larkin, David J., Neudeck, Philip G., Powell, J. Anthony, Matus, Lawrence G.

    Published in Applied physics letters (26-09-1994)
    “…We present and discuss a novel dopant control technique for compound semiconductors, called site-competition epitaxy, which enables a much wider range of…”
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    Journal Article
  3. 3

    Growth of step-free surfaces on device-size (0001)SiC mesas by Powell, J. Anthony, Neudeck, Philip G., Trunek, Andrew J., Beheim, Glenn M., Matus, Lawrence G., Hoffman, Richard W., Keys, Luann J.

    Published in Applied physics letters (04-09-2000)
    “…It is believed that atomic-scale surface steps cause defects in single-crystal films grown heteroepitaxially on SiC substrates. A method is described whereby…”
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    Journal Article
  4. 4

    Mechanical properties of 3C silicon carbide by Tong, Lijun, Mehregany, Mehran, Matus, Lawrence G.

    Published in Applied physics letters (15-06-1992)
    “…The residual stress and Young's modulus of 3C silicon carbide (SiC) epitaxial films deposited on silicon substrates were measured by load-deflection…”
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    Journal Article
  5. 5

    2000 V 6H-SiC p - n junction diodes grown by chemical vapor deposition by Neudeck, Philip G., Larkin, David J., Powell, J. Anthony, Matus, Lawrence G., Salupo, Carl S.

    Published in Applied physics letters (14-03-1994)
    “…In this letter we report on the fabrication and initial electrical characterization of the first silicon carbide diodes to demonstrate rectification to reverse…”
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    Journal Article
  6. 6

    Electrical properties of epitaxial 3C- and 6H-SiC p-n junction diodes produced side-by-side on 6H-SiC substrates by Neudeck, P.G., Larkin, D.J., Starr, J.E., Powell, J.A., Salupo, C.S., Matus, L.G.

    Published in IEEE transactions on electron devices (01-05-1994)
    “…3C-SiC (/spl beta/-SiC) and 6H-SiC p-n junction diodes have been fabricated in regions of both 3C-SiC and 6H-SiC epitaxial layers which were grown side-by-side…”
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    Journal Article
  7. 7
  8. 8

    Greatly improved 3C-SiC p-n junction diodes grown by chemical vapor deposition by Neudeck, P.G., Larkin, D.J., Starr, J.E., Powell, J.A., Salupo, C.S., Matus, L.G.

    Published in IEEE electron device letters (01-03-1993)
    “…The fabrication and initial electrical characterization of greatly improved 3C-SiC ( beta -SiC) p-n junction diodes are reported. These diodes, which were…”
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    Journal Article
  9. 9
  10. 10

    Silicon carbide as a new micromechanics material by Lijun Tong, Mehregany, M., Matus, L.G.

    “…Silicon carbide (SiC) is studied as a material for micromechanics because of its high-temperature microelectronics capabilities and excellent mechanical…”
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    Conference Proceeding