Search Results - "Mattos, Andre M. P."
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Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories Onboard PROBA-V
Published in IEEE transactions on nuclear science (01-08-2024)“…This work investigates the flight behavior of static random access memories (SRAMs) onboard the PROBA-V satellite. During the mission, unexpected error rates…”
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Journal Article -
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-On-Chip
Published in IEEE transactions on nuclear science (01-08-2024)“…The New Space era has driven a wide array of applications in novel space missions with an increasing demand for processors with high computational capabilities…”
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Journal Article -
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments
Published in 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (03-10-2023)“…Processing units are sensitive to the harsh radiation conditions present in space applications. Thus, radiation testing is a mandatory step toward high…”
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Conference Proceeding -
4
Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments
Published in 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI) (08-06-2023)“…Sensing systems are present in most application domains, including those in harsh environments. These systems are often designed around processing units…”
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Conference Proceeding -
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
Published in 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (19-10-2022)“…The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors…”
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Conference Proceeding -
6
Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V
Published in IEEE transactions on nuclear science (2024)“…This work investigates the flight behavior of Static Random-Access Memories (SRAMs) on board the PROBA-V satellite. During the mission, unexpected error rates…”
Get full text
Journal Article