Search Results - "Mattos, Andre M. P."

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  1. 1

    Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories Onboard PROBA-V by Mattos, Andre M. P., Santos, Douglas A., Luza, Lucas M., Gupta, Viyas, Borel, Thomas, Dilillo, Luigi

    Published in IEEE transactions on nuclear science (01-08-2024)
    “…This work investigates the flight behavior of static random access memories (SRAMs) onboard the PROBA-V satellite. During the mission, unexpected error rates…”
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    Journal Article
  2. 2

    Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-On-Chip by Santos, Douglas A., Aviles, Pablo M., Mattos, Andre M. P., Garcia-Valderas, Mario, Entrena, Luis, Lindoso, Almudena, Dilillo, Luigi

    Published in IEEE transactions on nuclear science (01-08-2024)
    “…The New Space era has driven a wide array of applications in novel space missions with an increasing demand for processors with high computational capabilities…”
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    Journal Article
  3. 3

    Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments by Santos, Douglas A., Mattos, Andre M. P., Melo, Douglas R., Dilillo, Luigi

    “…Processing units are sensitive to the harsh radiation conditions present in space applications. Thus, radiation testing is a mandatory step toward high…”
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    Conference Proceeding
  4. 4

    Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments by Mattos, Andre M. P., Santos, Douglas A., Imianosky, Carolina, Melo, Douglas R., Dilillo, Luigi

    “…Sensing systems are present in most application domains, including those in harsh environments. These systems are often designed around processing units…”
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    Conference Proceeding
  5. 5

    Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip by Santos, Douglas A., Mattos, Andre M. P., Luza, Lucas M., Cazzaniga, Carlo, Kastriotou, Maria, Melo, Douglas R., Dilillo, Luigi

    “…The radiation in harsh environments affects electronic systems, inducing permanent and temporary errors. These effects lead to unpredictable behaviors…”
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    Conference Proceeding
  6. 6

    Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V by Mattos, André M P, Santos, Douglas A, Luza, Lucas M, Gupta, Viyas, Borel, Thomas, Dilillo, Luigi

    “…This work investigates the flight behavior of Static Random-Access Memories (SRAMs) on board the PROBA-V satellite. During the mission, unexpected error rates…”
    Get full text
    Journal Article