Search Results - "Matos, Jefferson Almeida"
-
1
Electrical Characterization of Ω-Gate Nanowire MOSFETs Down to Cryogenic Temperatures
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28-08-2023)“…This work presents the electrical characterization of Ω-gate SOI nanowire MOSFETs in the temperature range from 82 K to 330 K. Devices with different fin…”
Get full text
Conference Proceeding -
2
Experimental Comparison of Junctionless and Inversion-Mode Nanowire SOI MOSFETs Down to Cryogenics Temperatures
Published in 2024 38th Symposium on Microelectronics Technology and Devices (SBMicro) (02-09-2024)“…This paper evaluates the electrical characteristics of Inversion-mode (IM) and Junctionless (JNT) SOI nanowire MOSFETs across a temperature spectrum from 300K…”
Get full text
Conference Proceeding