Search Results - "Matana Luza, L."
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1
On the evaluation of FPGA radiation benchmarks
Published in Microelectronics and reliability (01-11-2021)“…This paper presents a benchmarking methodology to analyse the failure mechanisms of FPGAs under radiation, using comparative results on the radiation…”
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Journal Article -
2
Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01-09-2019)“…The vertical line fault mechanism occurring in NAND flash devices under heavy-ion irradiation is described in detail. The location where the fault is generated…”
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Conference Proceeding