Search Results - "Matana Luza, L."

  • Showing 1 - 2 results of 2
Refine Results
  1. 1

    On the evaluation of FPGA radiation benchmarks by Bricas, G., Tsiligiannis, G., Touboul, A., Boch, J., Kastriotou, M., Cazzaniga, C., Frost, C.D., Dilillo, L., Matana Luza, L.

    Published in Microelectronics and reliability (01-11-2021)
    “…This paper presents a benchmarking methodology to analyse the failure mechanisms of FPGAs under radiation, using comparative results on the radiation…”
    Get full text
    Journal Article
  2. 2

    Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash by Gupta, V., Besser, A., Luza, L. Matana, Soderstrom, D., Javanainen, A., Kettunen, H., Praks, J., Voss, K.-O., Virtanen, A., Dilillo, L.

    “…The vertical line fault mechanism occurring in NAND flash devices under heavy-ion irradiation is described in detail. The location where the fault is generated…”
    Get full text
    Conference Proceeding