Search Results - "Marmiroli, A."

Giant Random Telegraph Signals in Nanoscale Floating-Gate Devices by Fantini, P., Ghetti, A., Marinoni, A., Ghidini, G., Visconti, A., Marmiroli, A.

“…The magnitude of a random telegraph signal (RTS) in nanoscale floating-gate devices has been experimentally investigated as a function of carrier…”
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A new compact DC model of floating gate memory cells without capacitive coupling coefficients by Larcher, L., Pavan, P., Pietri, S., Albani, L., Marmiroli, A.

“…This paper presents for the first time a new compact SPICE model of floating gate nonvolatile memory cells capable to reproduce effectively the complete DC…”
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Vacuum-assisted mini-percutaneous nephrolithotomy is associated with lower rates of infectious complications compared to standard procedures in low-risk patients: A single-center experience by Zanetti, S.P., Nizzardo, M., Nardini, S., Marmiroli, A., Quistini, A., Roberto, D., Scanferla, E., Molteni, S., Longo, F., Albo, G., De Lorenzis, E., Montanari, E., Boeri, L.

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A0974 - Vacuum-assisted mini-percutaneous nephrolithotomy is associated with lower rates of infectious complications compared to standard procedures in low-risk patients: A single-center experience by Zanetti, S.P., Nizzardo, M., Nardini, S., Marmiroli, A., Quistini, A., Roberto, D., Scanferla, E., Molteni, S., Longo, F., Albo, G., De Lorenzis, E., Montanari, E., Boeri, L.

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A0163 - The impact of the surgical waiting list for transurethral resection of the prostate on patient’s clinical course: A single center investigation by Boeri, L., Roberto, D., Scanferla, E., Molteni, S., Marmiroli, A., Nizzardo, M., Nardini, S., Quistini, A., Zanetti, S.P., Longo, F., Albo, G., Montanari, E., De Lorenzis, E.

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The impact of the surgical waiting list for transurethral resection of the prostate on patient’s clinical course: A single center investigation by Boeri, L., Roberto, D., Scanferla, E., Molteni, S., Marmiroli, A., Nizzardo, M., Nardini, S., Quistini, A., Zanetti, S.P., Longo, F., Albo, G., Montanari, E., De Lorenzis, E.

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TEM/CBED determination of strain in silicon-based submicrometric electronic devices by Armigliato, A, Balboni, R, Balboni, S, Frabboni, S, Tixier, A, Carnevale, G.P, Colpani, P, Pavia, G, Marmiroli, A

“…The convergent beam electron diffraction technique (CBED) of the transmission electron microscopy (TEM) has been employed to determine the strain distribution…”
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Differences in oncological outcomes in patients treated with thermal ablation for T1 renal cell masses: complete ablation vs. partial ablation +/- immediate re-treatment by Molinari, F., Mistretta, F.A., Luzzago, S., Marmiroli, A., Blezien, O., Di Trapani, E., Fontana, M., Cioffi, A., Bottero, D., Matei, D.V., Mauri, G., Orsi, F., Ferro, M., Musi, G., De Cobelli, O.

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Perioperative and oncological outcomes in patients with a solitary kidney treated with thermal ablation for T1 renal cell tumour by Marmiroli, A., Mistretta, F.A., Luzzago, S., Vaccaro, C., Tozzi, M., Cozzi, G., Bianchi, R., Di Trapani, E., Brescia, A., Cordima, G., Mauri, G., Orsi, F., Ferro, M., Musi, G., de Cobelli, O.

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Peri-operative complications in patients treated with thermal ablation for T1 renal cell tumors: descriptive analysis and independent predictors by Marmiroli, A., Luzzago, S., Mistretta, F.A., Vaccaro, C., Tozzi, M., Fontana, M., Cioffi, A., Cozzi, G., Bottero, D., Matei, D.V., Mauri, G., Orsi, F., Ferro, M., Musi, G., de Cobelli, O.

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Thermal ablation for small renal masses: identifying the most appropriate tumor size cut-off for predicting perioperative and oncological outcomes by Vaccaro, C., Luzzago, S., Mistretta, F.A., Marmiroli, A., Tozzi, M., Bianchi, R., Di Trapani, E., Fontana, M., Brescia, A., Cordima, G., Mauri, G., Orsi, F., Ferro, M., Musi, G., de Cobelli, O.

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Influence of the silicon nitride oxidation on the performances of NCLAD isolation by Tixier, A., Senez, V., Baccus, B., Marmiroli, A., Colpani, P., Rebora, A., Carnevale, G.P.

“…In order to study NCLAD isolation structures, a silicon nitride oxidation model has been studied and implemented in the process simulation program IMPACT-4…”
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Process Analysis using RSM and Simulation by Cecchetti, M., Lissoni, M., Lombardi, C., Marmiroli, A.

“…In this paper a statistical analysis of an advanced CMOS process performed using the Response Surface Method (RSM) applied to process/device simulation is…”
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Aluminum Thinning onto Blanket and Etched Back Tungsten Plugs: Simulation of Geometrical Effects by Marangon, M.S., De Santi, G., Marmiroli, A., Pasinetti, R.

“…The blanket and etch back technique has been been introduced successfully in process flows for vias and contact holes filling. The possibility of application…”
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Modeling of STI-induced stress phenomena in CMOS 90nm Flash technology by Fantini, P., Giuga, G., Schippers, S., Marmiroli, A., Ferrari, G.

“…A non negligible layout sensitivity of MOSFETS electrical behavior has been recently observed in advanced CMOS technologies. Some efforts have been attempted…”
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Modeling the VTH fluctuations in nanoscale Floating Gate memories by Calderoni, A., Fantini, P., Ghetti, A., Marmiroli, A.

“…Tight bits distribution is a must to fabricate multi-level Non-Volatile Memory (NVM) technology needed to reach a high degree of integration. On the contrary,…”
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Implementation of nitride oxidation in the 2D process simulator IMPACT-4 by Tixier, A., Senez, V., Baccus, B., Marmiroli, A.

“…To shrink the dimension of devices, new isolation technologies, with respect to classical LOCOS, have to be evaluated. This paper deals with the study of one…”
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Device simulation for smart integrated systems (DESSIS) by Baccarani, G., Rudan, M., Lorenzini, M., Fichtner, W., Litsios, J., Schenk, A., van Staa, P., Kaeser, L., Kampmann, A., Marmiroli, A., Sala, C., Ravanelli, E.

“…In this paper we present the most important achievements of the ESPRIT 6075 (DESSIS) Project, which was carried out in the period 1992-1995 with the…”
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Influence of the Silicon Nitride Oxidation on the Performances of NCLAD Isolation by Tixier, A., Senez, V., Baccus, B., Marmiroli, A., Carnevale, G.P., Colpani, P., Rebora, A.

“…A Deal and Grove model for the oxidation of the nitride isolation masks has been found, and has been implemented in the 2D Process simulator IMPACT-4 [2]. This…”
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