New technological possibilities for formation of GaAs and InP epitaxial layers for Gunn diodes
We consider a novel technological approach to formation of structurally-perfect indium-phosphide and gallium-arsenide epitaxial n-layers grown on specially prepared porous n + -InP and n + -GaAs substrates. The structural properties of epitaxial layers and output parameters of the Gunn diodes made o...
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Published in: | 2005 15th International Crimean Conference Microwave & Telecommunication Technology Vol. 2; pp. 633 - 634 Vol. 2 |
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Main Authors: | , , , , , , , , , , , |
Format: | Conference Proceeding |
Language: | English |
Published: |
IEEE
2005
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Subjects: | |
Online Access: | Get full text |
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Summary: | We consider a novel technological approach to formation of structurally-perfect indium-phosphide and gallium-arsenide epitaxial n-layers grown on specially prepared porous n + -InP and n + -GaAs substrates. The structural properties of epitaxial layers and output parameters of the Gunn diodes made on their basis were studied. The InP and GaAs epitaxial layers were grown in the same conditions on the standard substrates. The advantages of the epitaxial layers grown on porous substrates and Gunn diodes made on their basis are demonstrated |
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ISBN: | 9667968804 9789667968809 |
DOI: | 10.1109/CRMICO.2005.1565069 |