Search Results - "Marichal, O."
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1
Advanced SCR ESD protection circuits for CMOS/SOI nanotechnologies
Published in Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 (2005)“…This paper reviews the application of SCR-based ESD protection circuits in advanced CMOS/SOI technologies. The devices are integrated in a flexible modular…”
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Conference Proceeding -
2
Characterizing the transient device behavior of SCRs by means of VFTLP waveform analysis
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01-09-2007)“…New insights regarding the interpretation of the VFTLP IV-curve and the fast transient current and voltage waveform data are presented. These insights are used…”
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Conference Proceeding -
3
SCR based ESD protection in nanometer SOI technologies
Published in 2005 Electrical Overstress/Electrostatic Discharge Symposium (01-09-2005)“…This paper introduces an SCR based ESD protection design for SOI technologies. It is explained how efficient SCR devices can be constructed in SOI. These…”
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Conference Proceeding -
4
CDM analysis on 65nm CMOS: Pitfalls when correlating results between IO test chips and product level
Published in EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium (01-09-2008)“…Unlike HBM and MM, CDM robustness is highly dependent on IC layout and packaging. Therefore, IC companies mimic IC IO rings on IO-TEG test chips to select the…”
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Conference Proceeding