Investigation on the Trap Signature in Organic Semiconductor Turmeric Film Through Current–Voltage Analysis
The analytical description of the trap signature in the charge conduction process of turmeric dye-based organic semiconductor has been presented in this study. An analytical explanation of the built-in potential V x – V graph that emphasizes the presence of trapping states has been provided. Differe...
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Published in: | Transactions of Tianjin University Vol. 26; no. 4; pp. 265 - 272 |
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Main Authors: | , , , |
Format: | Journal Article |
Language: | English |
Published: |
Tianjin
Tianjin University
01-08-2020
Springer Nature B.V Department of Physics, Jadavpur University, Kolkata 700032, India%School of Energy Studies, Jadavpur University, Kolkata 700032, India%Department of Mechanical Engineering, Jadavpur University, Kolkata 700032, India |
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Online Access: | Get full text |
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Summary: | The analytical description of the trap signature in the charge conduction process of turmeric dye-based organic semiconductor has been presented in this study. An analytical explanation of the built-in potential
V
x
–
V
graph that emphasizes the presence of trapping states has been provided. Differential analysis of current–voltage (
I
–
V
) characteristics has also been conducted to verify the trap signature of the carrier in the device. The non-monotonous decrement of the
G
(
V
)–
V
plot verifies the trap signature. The values of trap energy (
E
t
) and trap factor (
θ
) have been derived from the logarithmic
I
–
V
relationship. From the analysis of the semilogarithmic
I
–
V
plot, the barrier height (
ϕ
bi
) of the device has also been determined. The overall
I
–
V
curve has been taken into account to examine the Richardson–Schottky and Poole–Frenkel effects on the trap-assisted charge conduction process. From the results of the experiment, the Schottky effect has been observed to be effective, which leads to a bulk-limited charge conduction process. |
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ISSN: | 1006-4982 1995-8196 |
DOI: | 10.1007/s12209-020-00259-3 |