Search Results - "Mancini, Stephen A"
-
1
Investigation of Static Performances of 1.2kV 4H-SiC MOSFETs Fabricated Using All 'Room Temperature' Ion Implantations
Published in IEEE journal of the Electron Devices Society (2024)“…Several different designs of 1.2kV-rated 4H-SiC MOSFETs have been successfully fabricated under various ion implantation conditions. Implantation conditions…”
Get full text
Journal Article -
2
600 V 4H-SiC Lateral Bi-Directional JBS Diode Integrated MOSFET (L-BiD-JBSFET)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02-06-2024)“…This paper presents the successful demonstration of a 600 V 4H-SiC lateral bi-directional JBS diode integrated MOSFET (L-BiD-JBSFET). The unit cell of the…”
Get full text
Conference Proceeding -
3
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01-03-2023)“…This paper reports static, dynamic, and short-circuit characteristics of split-gate (SG) 1.2 kV 4H-SiC MOSFETs. Conventional (C) MOSFETs and SG-MOSFETs were…”
Get full text
Conference Proceeding -
4
Increased 3rd Quadrant Current Handling Capability of 1.2kV 4H-SiC JBS Diode-Integrated MOSFETs (JBSFETs) with Minimal Impact on the Forward Conduction and Blocking Performances
Published in 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) (07-11-2021)“…Several designs of 1.2kV-rated 4H-SiC JBS diode integrated MOSFETs (JBSFETs) have been successfully fabricated in order to increase the 3 rd quadrant device…”
Get full text
Conference Proceeding -
5
Monolithically Integrated >3kV, 20A 4H-SiC BiDFET Utilizing an Accumulation Mode Channel for Improved Output Characteristics
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02-06-2024)“…This paper presents the first successfully demonstrated monolithically integrated > 3\text{kV} 4H-SiC Bi-Directional FETs (BiDFETs) fabricated utilizing both…”
Get full text
Conference Proceeding -
6
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01-03-2022)“…Several designs of 1.2kV-rated 4H-SiC PiN diodes and Junction Barrier Schottky (JBS) diodes have been successfully fabricated with various P+ implantation…”
Get full text
Conference Proceeding -
7
Exploring Optimum Designs for 1.2kV 4H-SiC JBS Diode Integrated MOSFETs (JBSFETs)
Published in 2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) (07-11-2022)“…Several different designs of 1.2kV-rated 4H-SiC JBS diode integrated MOSFETs (JBSFETs) have been successfully fabricated to increase the 3 rd quadrant device…”
Get full text
Conference Proceeding