Low-energy electron microscopy of layer spacings and quantum electronic structure of ultrathin films

Laterally resolved measurements of the quantum size effect in electron reflectivity are made with low‐energy electron microscopy on Cu films on a W(110) surface. These measurements discriminate quantum interference peaks (QIPs) from regions of different film thickness. A Kronig–Penney model and a ph...

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Bibliographic Details

Published in:	Surface and interface analysis Vol. 37; no. 2; pp. 235 - 238
Main Authors:	Man, Icarus K. H., Altman, M. S.
Format:	Journal Article Conference Proceeding
Language:	English
Published:	Chichester, UK John Wiley & Sons, Ltd 01-02-2005 Wiley
Subjects:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science; rheology Exact sciences and technology Low energy electron microscopy Physics quantum well resonances ultrathin films Ultrathin films Low energy electron microscopy Electronic structure Low energy electron quantum well resonances Quantum wells
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