Search Results - "Mamanee, W."

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  1. 1

    Application of transient interferometric mapping method for ESD and latch-up analysis by Pogany, D., Bychikhin, S., Heer, M., Mamanee, W., Gornik, E.

    Published in Microelectronics and reliability (01-09-2011)
    “…Transient Interferometric Mapping (TIM) tools are reviewed from a perspective of their particular application area and comparison to other transient optical…”
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    Journal Article Conference Proceeding
  2. 2

    Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices by Heer, M., Bychikhin, S., Mamanee, W., Pogany, D., Heid, A., Grombach, P., Klaussner, M., Soppa, W., Ramler, B.

    Published in Microelectronics and reliability (01-09-2007)
    “…Triggering uniformity and current sharing under TLP stress is investigated in low voltage multi-finger gg-NMOS and NPN ESD protection devices fabricated in…”
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    Journal Article Conference Proceeding
  3. 3

    Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes by Johnsson, D., Mamanee, W., Bychikhin, S., Pogany, D., Gornik, E., Stecher, M.

    “…Bipolar ESD protection devices subjected to low current long pulse stress can sustain a relatively long time during thermal second breakdown without any…”
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    Conference Proceeding
  4. 4

    A Three-stage Thermopneumatic Peristaltic Micropump for PDMS-based Micro/Nanofluidic Systems by Tuantranont, A., Mamanee, W., Lomas, T., Porntheerapat, N., Afzulpurkar, N.V., Wisitsoraat, A.

    “…A three-stage thermopnuematic peristaltic micropump for controlling micro to nano litters of fluid was simply designed and fabricated from PDMS on glass slide…”
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    Conference Proceeding
  5. 5

    Effect of Elevated Ambient Temperature on Thermal Breakdown Behavior in BCD ESD Protection Devices Subjected to Long Electrical Overstress Pulses by Mamanee, W., Bychikhin, S., Johnsson, D., Jensen, N., Stecher, M., Gornik, E., Pogany, D.

    “…We investigate the effect of elevated ambient temperature on thermal breakdown (TB) modes in linear-geometry electrostatic discharge (ESD) protection n-p-n…”
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    Magazine Article