Search Results - "Mamanee, W."
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1
Application of transient interferometric mapping method for ESD and latch-up analysis
Published in Microelectronics and reliability (01-09-2011)“…Transient Interferometric Mapping (TIM) tools are reviewed from a perspective of their particular application area and comparison to other transient optical…”
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Journal Article Conference Proceeding -
2
Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices
Published in Microelectronics and reliability (01-09-2007)“…Triggering uniformity and current sharing under TLP stress is investigated in low voltage multi-finger gg-NMOS and NPN ESD protection devices fabricated in…”
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Journal Article Conference Proceeding -
3
Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes
Published in 2008 IEEE International Reliability Physics Symposium (01-04-2008)“…Bipolar ESD protection devices subjected to low current long pulse stress can sustain a relatively long time during thermal second breakdown without any…”
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Conference Proceeding -
4
A Three-stage Thermopneumatic Peristaltic Micropump for PDMS-based Micro/Nanofluidic Systems
Published in 2007 7th IEEE Conference on Nanotechnology (IEEE NANO) (01-08-2007)“…A three-stage thermopnuematic peristaltic micropump for controlling micro to nano litters of fluid was simply designed and fabricated from PDMS on glass slide…”
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Conference Proceeding -
5
Effect of Elevated Ambient Temperature on Thermal Breakdown Behavior in BCD ESD Protection Devices Subjected to Long Electrical Overstress Pulses
Published in IEEE transactions on device and materials reliability (01-09-2012)“…We investigate the effect of elevated ambient temperature on thermal breakdown (TB) modes in linear-geometry electrostatic discharge (ESD) protection n-p-n…”
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Magazine Article