Search Results - "Malhi, S.D.S."

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    Characteristics and three-dimensional integration of MOSFET's in small-grain LPCVD polycrystalline Silicon by Malhi, S.D.S., Shichijo, H., Banerjee, S.K., Sundaresan, R., Elahy, M., Pollack, G.P., Richardson, W.F., Shah, A.H., Hite, L.R., Womack, R.H., Chatterjee, P.K., Lam, H.W.

    Published in IEEE transactions on electron devices (01-02-1985)
    “…Building on nearly two decades of reported results for MOSFET's fabricated in small-grain polycrystalline silicon, a design methodology is developed that…”
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    Journal Article
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    Characteristics and Three-Dimensional Integration of MOSFET's in Small-Grain LPCVD Polycrystalline Silicon by Malhi, S.D.S., Shichijo, H., Banerjee, S.K., Sundaresan, R., Elahy, M., Pollack, G.P., Richardson, W.F., Shah, A.H., Hite, L.R., Womack, R.H., Chatterjiee, P.K., Hon Wai Lam

    Published in IEEE journal of solid-state circuits (01-02-1985)
    “…Building on nearly two decades of reported results for MOSFET's fabricated in small-grain polycrystalline silicon, a design methodology is developed that…”
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    Journal Article
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    Process and performance comparison of an 8K × 8-bit SRAM in three stacked CMOS technologies by Hite, L.R., Sundaresan, R., Malhi, S.D.S., Lam, H.W., Shah, A.H., Hester, R.K., Chatterjee, P.K.

    Published in IEEE electron device letters (01-10-1985)
    “…Using self-aligned and non-self-aligned stacked CMOS technologies experimental 8K × 8-bit static random-access memories (SRAM'S) have been fabricated. Hydrogen…”
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    Journal Article
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    Hydrogen passivation of PolySilicon MOSFET's from a plasma Nitride source by Pollack, G.P., Richardson, W.F., Malhi, S.D.S., Bonifield, T., Shichijo, H., Banerjee, S., Elahy, M., Shah, A.H., Womack, R., Chatterjee, P.K.

    Published in IEEE electron device letters (01-11-1984)
    “…Improvements in polysilicon grain-boundary passivation techniques have made polysilicon MOSFET's increasingly attractive, as vertically stackable circuit…”
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    Journal Article
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    A 4-Mbit DRAM with trench-transistor cell by Shah, A.H., Wang, C., Womack, R.H., Gallia, J.D., Shichijo, H., Davis, H.E., Elahy, M., Banerjee, S.K., Pollack, G.P., Richardson, W.F., Bordelon, D.M., Malhi, S.D.S., Pilch, C.J., Tran, B., Chatterjee, P.K.

    Published in IEEE journal of solid-state circuits (01-10-1986)
    “…An experimental 5-V-only 1M-word/spl times/4-bit dynamic RAM with page and SCD modes has been built in a relatively conservative 1-/spl mu/m CMOS technology…”
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    Journal Article
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    Stacked CMOS SRAM cell by Chen, C.-E., Lam, H.W., Malhi, S.D.S., Pinizzotto, R.F.

    Published in IEEE electron device letters (01-08-1983)
    “…A static random access memory (SRAM) cell with cross-coupled stacked CMOS inverters is demonstrated for the first time. In this approach, CMOS inverters are…”
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    Journal Article
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    Thermal annealing behavior of an oxide layer under silicon by Hamdi, A. H., McDaniel, F. D., Pinizzotto, R. F., Matteson, S., Lam, H. W., Malhi, S. D. S.

    Published in Applied physics letters (15-12-1982)
    “…High resolution Rutherford backscattering spectrometry and ion channeling have been employed to evaluate the crystallinity of the surface silicon layer in…”
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    Journal Article
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    Novel SOI CMOS design using ultra thin near intrinsic substrate by Malhi, S.D.S., Lam, H.W., Pinizzotto, R.F., Hamdi, A.H., McDaniel, F.D.

    “…A novel SOI CMOS design has been explored. It utilizes an ultra thin near intrinsic substrate wherein no channel doping is introduced during processing. The…”
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    Conference Proceeding
  10. 10

    A low-voltage micropower JFET/bipolar operational amplifier by Malhi, S.D.S., Salama, C.A.T., Donnison, W.R.

    Published in IEEE journal of solid-state circuits (01-12-1981)
    “…A single cell supply (operable down to 1.2 V) micropower operational amplifier using compatible low pinchoff voltage JFET's (V/SUB p/=0.4 V) in conjunction…”
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    Journal Article
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    p-Channel MOSFET's in LPCVD PolySilicon by Malhi, S.D.S., Chatterjee, P.K., Pinizzotto, R.F., Lam, H.W., Chen, C.E.C., Shichijo, H., Shah, R.R., Bellavance, D.W.

    Published in IEEE electron device letters (01-10-1983)
    “…p-channel MOSFET's have been fabricated in LPCVD polysilicon. A 5000-Å n + poly acts as the gate electrode on which a 500-Å thermal oxide is grown to act as…”
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    Journal Article
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    Subsurface junction field effect transistor by Malhi, S.D.S., Salama, C.A.T., Donnison, W.R., Barber, H.D.

    Published in IEEE transactions on electron devices (01-12-1981)
    “…A novel bipolar compatible junction field effect transistor structure is described in this paper. The device is fabricated using a single boron implant at…”
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    Journal Article
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    Edge-defined self-alignment of submicrometer overlaid devices by Malhi, S.D.S., Chatterjee, P.K., Bonifield, T.D., Leiss, J.E., Carter, D.E., Pinizzotto, R.F., Coleman, D.J.

    Published in IEEE electron device letters (01-10-1984)
    “…A novel device structure for self-aligning the overlaid device in a stacked CMOS process is introduced and demonstrated. The structure allows submicrometer…”
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    Journal Article
  17. 17

    Trench transistor DRAM cell by Shichijo, H., Banerjee, S.K., Malhi, S.D.S., Pollack, G.P., Richardson, W.F., Bordelon, D.M., Womack, R.H., Elahy, M., Wang, C.-P., Gallia, J., Davis, H.E., Shah, A.H., Chatterjee, P.K.

    Published in IEEE electron device letters (01-02-1986)
    “…A new one-transistor DRAM cell with both the transistor and the capacitor fabricated on the trench sidewalls is described. With the signal stored on the…”
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    Journal Article
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    SOI CMOS circuit performance on graphite strip heater recrystallized material by Malhi, S.D.S., Lam, H.W., Pinizzotto, R.F.

    “…A CMOS process has been implemented on graphite strip heater recrystallized silicon substrates. The low field electron mobility of 660 cm 2 /V.sec and hole…”
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    Conference Proceeding
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    Orthogonal chip mount - A 3D hybrid wafer scale integration technology by Malhi, S.D.S., Davis, H.E., Stierman, R.J., Bean, K.E., Driscoll, C.C., Chatterjee, P.K.

    “…In the last decade, device scaling in the integrated circuit technology has permitted a drastic improvement in the density of electronic systems. This trend…”
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    Conference Proceeding