Search Results - "Maki, Michiyoshi"

Suppression of oxidation-stacking-fault generation by preannealing in N2 atmosphere by Kishino, Seigô, Isomae, Seiichi, Tamura, Masao, Maki, Michiyoshi

“…Suppression of oxidation-stacking-fault (OSF) generation is studied by x-ray section topography, etching technique, and transmission electron microscopy (TEM)…”
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Causes of Thickness Non-Uniformity in Silicon Ribbon Crystals by Kuroda, Ekyo, Matsuda, Masatoshi, Maki, Michiyoshi

“…Three kinds of thickness non-uniformity in silicon ribbon crystals grown using graphite dies were observed, and the cause of each type of non-uniformity…”
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Observations of Channels of MOS Field Effect Transistors Using a Scanning-Electron Microscope by Higuchi, Hisayuki, Maki, Michiyoshi

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Evaluation of Temperature Distribution of Melt in Silicon Ribbon Growth by Kuroda, Ekyo, Matsuda, Masatoshi, Kozuka, Hirotsugu, Maki, Michiyoshi

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Self-Isolated Transistor Structures of Bipolar Integrated Circuits by Makimoto, Tsugio, Sugawara, Katsuro, Maki, Michiyoshi

“…Self-isolated transistor structures for bipolar integrated circuits are proposed. Some of the advantageous features of the proposed structures are; negligible…”
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Photoemission study of the SiO2/Si interface structure of thin oxide film on vicinal Si(100) surface by Niwano, Michio, Katakura, Hitoshi, Takeda, Yuki, Takakuwa, Yuji, Miyamoto, Nobuo, Maki, Michiyoshi

“…The SiO2/Si interface structure of thin oxide films thermally grown on vicinal Si(100) surfaces with the surface normal inclined at small angles with respect…”
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X-Ray Topographic Study of Lattice Defects Related with Degradation of GaAs-Ga 1- x Al x As Double-Heterostructure Lasers by Kishino, Seigô, Nakashima, Hisao, Ito, Ryoichi, Nakada, Osamu, Maki, Michiyoshi

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Improved Si piezo-transistors for mechano-electrical transducers by Kanda, Y., Kanazawa, Y., Terada, T., Maki, M.

“…Piezo-transistors with stresses applied to the emitter region by means of small hard styli for application as mechano-electric transducers have been improved…”
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Observation of semiconductor elements using scanning electron microscope by Kimura, H, Higuchi, H, Maki, M, Tamura, H

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