Search Results - "Maher, M C"

Refine Results
  1. 1

    Characterization of enhanced low dose rate sensitivity (ELDRS) effects using Gated Lateral PNP transistor structures by Pease, R.L., Platteter, D.G., Dunham, G.W., Seiler, J.E., Barnaby, H.J., Schrimpf, R.D., Shaneyfelt, M.R., Maher, M.C., Nowlin, R.N.

    Published in IEEE transactions on nuclear science (01-12-2004)
    “…The high and low dose rate responses of bipolar transistors in a bipolar linear circuit process technology have been studied with specially designed gated…”
    Get full text
    Journal Article
  2. 2

    The effect of a limit-fed diet and slow-feed hay nets on morphometric measurements and postprandial metabolite and hormone patterns in adult horses by Glunk, E C, Hathaway, M R, Grev, A M, Lamprecht, E D, Maher, M C, Martinson, K L

    Published in Journal of animal science (01-08-2015)
    “…Modern horse management systems tend to limit a horse's opportunity to forage, rely on meal feeding, and may contribute to the increase in equine obesity. The…”
    Get full text
    Journal Article
  3. 3

    Plasma and synovial fluid concentration of doxycycline following low-dose, low-frequency administration, and resultant inhibition of matrix metalloproteinase-13 from interleukin-stimulated equine synoviocytes by Maher, M. C., Schnabel, L. V., Cross, J. A., Papich, M. G., Divers, T. J., Fortier, L. A.

    Published in Equine veterinary journal (01-03-2014)
    “…Summary Reasons for study To determine whether low‐dose, low‐frequency doxycycline administration is capable of achieving chondroprotective concentrations…”
    Get full text
    Journal Article
  4. 4

    Investigation of millisecond-long analog single-event transients in the LM6144 op amp by Boulghassoul, Y., Buchner, S., McMorrow, D., Pouget, V., Massengill, L.W., Fouillat, P., Holman, W.T., Poivey, C., Howard, J.W., Savage, M., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-12-2004)
    “…A new category of analog single-event transients (SETs) with millisecond-long durations have been experimentally observed in the LM6144 operational amplifier…”
    Get full text
    Journal Article
  5. 5

    Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions by Koga, R., Penzin, S.H., Crawford, K.B., Crain, W.R., Moss, S.C., Pinkerton, S.D., LaLumondiere, S.D., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-12-1997)
    “…The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset…”
    Get full text
    Journal Article
  6. 6

    Total-dose hardening of a bipolar-voltage comparator by Pease, R.L., Maher, M.C., Shaneyfelt, M.R., Savage, M.W., Baker, P., Krieg, J., Turflinger, T.L.

    Published in IEEE transactions on nuclear science (01-12-2002)
    “…A radiation-tolerant bipolar-voltage comparator experienced severe degradation of radiation hardness when layout of the part was redrawn and the process moved…”
    Get full text
    Journal Article
  7. 7

    The impact of mechanical stress on the total-dose response of linear bipolar transistors with various passivation layers by Cizmarik, R.R., Schrimpf, R.D., Fleetwood, D.M., Galloway, K.F., Platteter, D.G., Shaneyfelt, M.R., Pease, R.L., Boch, J., Ball, D.R., Rowe, J.D., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-10-2005)
    “…In this work, we investigate how externally applied mechanical stress impacts the total dose hardness and enhanced low-dose-rate sensitivity of linear bipolar…”
    Get full text
    Journal Article
  8. 8

    Origins of total-dose response variability in linear bipolar microcircuits by Barnaby, H.J., Cirba, C.R., Schrimpf, R.D., Fleetwood, D.M., Pease, R.L., Shaneyfelt, M.R., Turflinger, T., Krieg, J.F., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-12-2000)
    “…LM111 voltage comparators exhibit a wide range of total-dose-induced degradation. Simulations show this variability may be a natural consequence of the low…”
    Get full text
    Journal Article
  9. 9

    Annealing behavior of linear bipolar devices with enhanced low-dose-rate sensitivity by Shaneyfelt, M.R., Schwank, J.R., Fleetwood, D.M., Pease, R.L., Felix, J.A., Dodd, P.E., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-12-2004)
    “…The post-irradiation annealing behavior of total dose degradation in LM139 comparators fabricated in National Semiconductor Corporation's (NSC) enhanced…”
    Get full text
    Journal Article
  10. 10
  11. 11
  12. 12

    Passivation layers for reduced total dose effects and ELDRS in linear bipolar devices by Shaneyfelt, M.R., Pease, R.L., Maher, M.C., Schwank, J.R., Gupta, S., Dodd, P.E., Riewe, L.C.

    Published in IEEE transactions on nuclear science (01-12-2003)
    “…It is shown that final chip passivation layers can have a significant impact on total dose hardness. A number of final chip passivation layers are evaluated to…”
    Get full text
    Journal Article
  13. 13

    Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response by Barnaby, H.J., Schrimpf, R.D., Pease, R.L., Cole, P., Turflinger, T., Krieg, J., Titus, J., Emily, D., Gehlhausen, M., Witczak, S.C., Maher, M.C., van Nort, D.

    Published in IEEE transactions on nuclear science (01-12-1999)
    “…The input bias current (I/sub IB/) of the National LM111 voltage comparator exhibits a non-monotonic response to total dose irradiations at various dose rates…”
    Get full text
    Journal Article
  14. 14

    Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators by LaLumondiere, S.D., Koga, R., Yu, P., Maher, M.C., Moss, S.C.

    Published in IEEE transactions on nuclear science (01-12-2002)
    “…We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the…”
    Get full text
    Journal Article
  15. 15

    SEU and latchup tolerant advanced CMOS technology by Koga, R., Crawford, K.B., Hansel, S.J., Johnson, B.M., Lau, D.D., Penzin, S.H., Pinkerton, S.D., Maher, M.C.

    “…Selected microcircuits constructed in National Semiconductor's FACT (Fairchild advanced CMOS technology) were tested for heavy-ion-induced single event upset…”
    Get full text
    Journal Article Conference Proceeding
  16. 16
  17. 17

    The effect of a limit-fed diet and slow-feed hay nets on morphometric measurements and postprandial metabolite and hormone patterns in adult horses 1 by Glunk, E C, Hathaway, M R, Grev, A M, Lamprecht, E D, Maher, M C, Martinson, K L

    Published in Journal of animal science (01-08-2015)
    “…Modern horse management systems tend to limit a horse's opportunity to forage, rely on meal feeding, and may contribute to the increase in equine obesity. The…”
    Get full text
    Journal Article
  18. 18

    Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator by Krieg, J., Turflinger, T., Titus, J., Cole, P., Baker, P., Gehlhausen, M., Emily, D., Yang, L., Pease, R.L., Barnaby, H., Schrimpf, R., Maher, M.C.

    Published in IEEE transactions on nuclear science (01-12-1999)
    “…The total dose response of transistors and circuits from a single wafer lot has been measured for high and low dose rate and elevated temperature irradiations…”
    Get full text
    Journal Article
  19. 19

    Elimination of Enhanced Low-Dose-Rate Sensitivity in Linear Bipolar Devices Using Silicon-Carbide Passivation by Shaneyfelt, M.R., Maher, M.C., Camilletti, R.C., Schwank, J.R., Pease, R.L., Russell, B.A., Dodd, P.E.

    Published in IEEE transactions on nuclear science (01-08-2006)
    “…The type of final chip passivation layer used to fabricate linear bipolar circuits can have a major impact on the total dose hardness of some circuits. It is…”
    Get full text
    Journal Article
  20. 20

    The WISC-III Freedom From Distractibility Factor: Its Utility in Identifying Children With Attention Deficit Hyperactivity Disorder by Anastopoulos, Arthur D, Spisto, Marc A, Maher, Mary C

    Published in Psychological assessment (01-12-1994)
    “…This study examined the construct validity and diagnostic utility of the Wechsler Intelligence Scale for Children-Third Edition (WISC-III; Wechsler, 1991 )…”
    Get full text
    Journal Article